Abstract:
A sample and hold circuit including a sampling capacitor for storing a sample of an input signal, an output stage for outputting the sample stored on the sampling capacitor; and input circuitry for sampling the input signal and storing the sample on the sampling capacitor. The input circuitry includes an autozeroing input buffer which selectively samples the input signal during a first operating phase and holds a sample of the input signal during a second operating phase. The autozeroing input buffer cancels any offset error. The input circuitry also includes switching circuitry for selectively coupling the sampling capacitor with an input of the sample and hold circuitry during the second operating phase and to an output of the autozeroing input buffer during the first operating phase.
Abstract:
A method of testing an internal block of an integrated circuit includes testing an internal block under a selected operating condition by setting a selected operating parameter to a value emulating operation of the internal block under another operating condition to detect potential failure of the internal block under the another operating condition.