Measurements of multiple external components through a single pin of an integrated circuit
    1.
    发明授权
    Measurements of multiple external components through a single pin of an integrated circuit 有权
    通过集成电路的单个引脚测量多个外部组件

    公开(公告)号:US09521712B1

    公开(公告)日:2016-12-13

    申请号:US14445732

    申请日:2014-07-29

    CPC classification number: G01R27/2605 G01R27/14 H05B33/0842

    Abstract: Multiple measurements may be obtained via a single pin of an integrated circuit (IC) to set multiple control parameters of a light emitting diode (LED) controller within the IC. For example, a first input signal may be applied from the IC to two or more components via a single IC pin. A first output signal may be obtained from the two or more components via the single IC pin. A second input signal may be applied from the IC to the two or more components via the single IC pin, and a second output signal may be obtained from the two or more components via the single IC pin. A first parameter and a second parameter of the two or more components may be calculated based, at least in part, on the first output signal and the second output signal obtained via the single IC pin.

    Abstract translation: 可以通过集成电路(IC)的单个引脚获得多个测量值,以设置IC内的发光二极管(LED)控制器的多个控制参数。 例如,可以经由单个IC引脚从IC向两个或更多个组件施加第一输入信号。 可以经由单个IC引脚从两个或更多个组件获得第一输出信号。 可以经由单个IC引脚从IC向两个或更多个部件施加第二输入信号,并且可以经由单个IC引脚从两个或更多个部件获得第二输出信号。 可以至少部分地基于经由单个IC引脚获得的第一输​​出信号和第二输出信号来计算两个或更多个组件的第一参数和第二参数。

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