公开(公告)号：US12276565B2

公开(公告)日：2025-04-15

申请号：US18297412

申请日：2023-04-07

Applicant: Cisco Technology, Inc.

Inventor： Xunyuan Zhang ,  Ravi S. Tummidi ,  Tony P. Polous ,  Mark A Webster

IPC: G02B6/12 ,  G01M11/00

Abstract: Electrical test of optical components via metal-insulator-semiconductor capacitor structures is provided via a plurality of optical devices including a first material embedded in a second material, wherein each optical device is associated with a different thickness range of a plurality of thickness ranges for the first material; a first capacitance measurement point including the first material embedded in the second material; and a second capacitance measurement point including a region from which the first material has been replaced with the second material.