公开(公告)号：US12038479B2

公开(公告)日：2024-07-16

申请号：US17941386

申请日：2022-09-09

Applicant: Cisco Technology, Inc.

Inventor： James Edwin Turman ,  ShiJie Wen ,  Jie Xue ,  Zoe Frances Conroy ,  Dao-I Tony Lin ,  Anthony Winston

IPC: G01R31/319 ,  G01R31/3183 ,  G01R31/3185

CPC classification number: G01R31/31903 ,  G01R31/318342 ,  G01R31/318594 ,  G01R31/31905

Abstract: A method, computer system, and computer program product are provided for stress-testing electronics using telemetry modeling. Telemetry data is received from one or more devices under test during a hardware testing phase, the telemetry data including one or more telemetry parameters. The telemetry data is processed using a predictive model to determine future values for the one or more telemetry parameters. Additional hardware testing is performed, wherein the additional hardware testing includes adjusting one or more testing components based on the determined future values.

公开(公告)号：US20240085477A1

公开(公告)日：2024-03-14

申请号：US17941386

申请日：2022-09-09

Applicant: Cisco Technology, Inc.

Inventor： James Edwin Turman ,  ShiJie Wen ,  Jie Xue ,  Zoe Frances Conroy ,  Dao-I Tony Lin ,  Anthony Winston

IPC: G01R31/319 ,  G01R31/3183 ,  G01R31/3185

CPC classification number: G01R31/31905 ,  G01R31/318342 ,  G01R31/318594

Abstract: A method, computer system, and computer program product are provided for stress-testing electronics using telemetry modeling. Telemetry data is received from one or more devices under test during a hardware testing phase, the telemetry data including one or more telemetry parameters. The telemetry data is processed using a predictive model to determine future values for the one or more telemetry parameters. Additional hardware testing is performed, wherein the additional hardware testing includes adjusting one or more testing components based on the determined future values.