FRUIT MATURITY AND QUALITY SCANNING
    1.
    发明公开

    公开(公告)号:US20240302272A1

    公开(公告)日:2024-09-12

    申请号:US18178671

    申请日:2023-03-06

    发明人: Ioannis Minas

    IPC分类号: G01N21/3563 G01N21/3581

    摘要: The true impact of preharvest factors such as crop load, canopy position, cultivar and rootstock on peach internal quality can be determined using multivariate visible light radiation (Vis) and near infrared spectroscopy (NIRS) prediction models to non-destructively assess peach internal quality (dry matter content, DMC; soluble solids concentration, SSC) and maturity (index of absorbance difference, IAD). A novel crop load×fruit developmental stage protocol allowed accurate multivariate Vis-NIRS-based prediction models development for three major yellow fleshed peach typologies (fully red over-colored, early-ripening bi-colored and late-ripening bi-colored) to non-destructively assess peach internal quality (DMC and SSC) and maturity (IAD) with a single scan during fruit growth and development in the field. The impact of preharvest factors such as crop load and canopy position on peach quality and maturity can be evaluated across a variety of peach cultivars using this novel technology.