Apparatus and methods for dynamic passive intermodulation distortion testing

    公开(公告)号:US09863987B2

    公开(公告)日:2018-01-09

    申请号:US15335733

    申请日:2016-10-27

    IPC分类号: G01R23/20 G01N3/34 G01R31/28

    摘要: A passive intermodulation (“PIM”) distortion test apparatus includes a housing, hammering elements disposed within the housing, each hammering element including a moveable striking member, a strike plate positioned above the hammering elements, where a bottom surface of the strike plate is positioned at a distance above the hammering elements such that the moveable striking members of the hammering elements impact the strike plate when moved into their activated positions, and a retaining member that is configured to hold a device under test on a top surface of the strike plate while a PIM distortion test is performed on the device under test.