公开(公告)号：US11112459B2

公开(公告)日：2021-09-07

申请号：US16022989

申请日：2018-06-29

Applicant: Credo Technology Group Limited

Inventor： Haoli Qian ,  Yifei Dai ,  Ruiqing Sun

IPC: G01R31/3185

Abstract: A method for testing operation of a device under test (DUT) includes receiving an input bit stream at an input pin, the input bit stream including multiplexed test patterns for a plurality of scan chains of the DUT. The method further includes demultiplexing the multiplexed test patterns, and providing a corresponding test pattern data to each of the plurality of scan chains. The method further includes, at each of the plurality of scan chains, scanning test results from the scan chain, to produce multiplex output test data into an output bit stream.

公开(公告)号：US20180306862A1

公开(公告)日：2018-10-25

申请号：US16022989

申请日：2018-06-29

Applicant: Credo Technology Group Limited

Inventor： Haoli Qian ,  Yifei Dai ,  Ruiqing Sun

IPC: G01R31/3185

CPC classification number: G01R31/318563 ,  G01R31/318544 ,  G01R31/318572

Abstract: A method for testing operation of a device under test (DUT) includes receiving an input bit stream at an input pin, the input bit stream including multiplexed test patterns for a plurality of scan chains of the DUT. The method further includes demultiplexing the multiplexed test patterns, and providing a corresponding test pattern data to each of the plurality of scan chains. The method further includes, at each of the plurality of scan chains, scanning test results from the scan chain, to produce multiplex output test data into an output bit stream.