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公开(公告)号：US08660424B2
公开(公告)日：2014-02-25
申请号：US12869048
申请日：2010-08-26
申请人： D. Brice Achkir , Hugh Barrass
发明人： D. Brice Achkir , Hugh Barrass
CPC分类号： H04L43/50 , H04L43/0847 , H04L43/087 , Y04S40/168
摘要： A scalable signal processing test device and related signal processing techniques are provided herein for processing signals at a signal processing module of the scalable signal processing test device. Source electrical signals are processed to generate test electrical signals that model electrical signals produced by an optical module from received optical signals in accordance with a high speed optical standard for optical transmission. The test electrical signals are transmitted over transmit links to a host device that is configured to receive the test electrical signals in a format that would normally be produced by an optical module in accordance with the high speed optical standard. The test electrical signals are received after they have been looped back from the host device over receive links from the host device. The host device is a device that is configured to output the test electrical signals in a format suitable for processing by an optical module in accordance with the high speed optical standard. The test electrical signals received from the host device are analyzed in order to determine whether the host device outputs the one or more sets of test electrical signals in compliance with the high speed optical standard.
摘要翻译： 本文提供了可扩展信号处理测试设备和相关信号处理技术，用于在可伸缩信号处理测试设备的信号处理模块处处理信号。 源电信号被处理以产生测试电信号，该测试电信号根据用于光传输的高速光学标准从接收到的光信号模拟由光模块产生的电信号。 测试电信号通过发送链路传输到被配置为以通常由光模块根据高速光学标准产生的格式接收测试电信号的主机设备。 测试电信号在通过主机设备的接收链路从主机设备回放后被接收。 主机设备是被配置为以符合高速光学标准的光学模块适合于处理的格式输出测试电信号的设备。 分析从主机设备接收的测试电信号，以便确定主机设备是否输出符合高速光学标准的一组或多组测试电信号。
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公开(公告)号：US20120051735A1
公开(公告)日：2012-03-01
申请号：US12869048
申请日：2010-08-26
申请人： D. Brice Achkir , Hugh Barrass
发明人： D. Brice Achkir , Hugh Barrass
IPC分类号： H04B10/08
CPC分类号： H04L43/50 , H04L43/0847 , H04L43/087 , Y04S40/168
摘要： A scalable signal processing test device and related signal processing techniques are provided herein for processing signals at a signal processing module of the scalable signal processing test device. Source electrical signals are processed to generate test electrical signals that model electrical signals produced by an optical module from received optical signals in accordance with a high speed optical standard for optical transmission. The test electrical signals are transmitted over transmit links to a host device that is configured to receive the test electrical signals in a format that would normally be produced by an optical module in accordance with the high speed optical standard. The test electrical signals are received after they have been looped back from the host device over receive links from the host device. The host device is a device that is configured to output the test electrical signals in a format suitable for processing by an optical module in accordance with the high speed optical standard. The test electrical signals received from the host device are analyzed in order to determine whether the host device outputs the one or more sets of test electrical signals in compliance with the high speed optical standard.
摘要翻译： 本文提供了可扩展信号处理测试设备和相关信号处理技术，用于在可伸缩信号处理测试设备的信号处理模块处处理信号。 源电信号被处理以产生测试电信号，该测试电信号根据用于光传输的高速光学标准从接收到的光信号模拟由光模块产生的电信号。 测试电信号通过发送链路传输到被配置为以通常由光模块根据高速光学标准产生的格式接收测试电信号的主机设备。 测试电信号在通过主机设备的接收链路从主机设备回放后被接收。 主机设备是被配置为以符合高速光学标准的光学模块适合于处理的格式输出测试电信号的设备。 分析从主机设备接收的测试电信号，以便确定主机设备是否输出符合高速光学标准的一组或多组测试电信号。
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公开(公告)号：US08963573B2
公开(公告)日：2015-02-24
申请号：US13335661
申请日：2011-12-22
IPC分类号： G01R31/00 , G01R1/067 , H04L1/24 , G01R31/3185
CPC分类号： G01R1/067 , G01R31/3185 , H04L1/241 , H04L1/243
摘要： According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.
摘要翻译： 根据示例实现，通用测试器包括在电测试操作模式期间连接到第一可插拔主机卡的主机接口插槽，以向被测试主机提供受压电信号。 在光学测试操作模式期间，主机接口插槽连接到第二可插拔主机卡，第二可插拔主机卡包括电光转换模块，用于将应力电信号转换为被提供给主机的应力光信号 测试。 压力发生器可以在直通模式或环回模式下操作。
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公开(公告)号：US20130162279A1
公开(公告)日：2013-06-27
申请号：US13335661
申请日：2011-12-22
IPC分类号： G01R31/00
CPC分类号： G01R1/067 , G01R31/3185 , H04L1/241 , H04L1/243
摘要： According to an example implementation, a universal tester includes a host interface slot connected to a first pluggable host card during an electrical test mode of operation to provide a stressed electrical signal to a host under test. The host interface slot is connected to a second pluggable host card during an optical test mode of operation, the second pluggable host card including an electrical-optical conversion block to convert a stressed electrical signal to a stressed optical signal that is provided to a host under test. A stressor generator may operation in pass-through mode or a loop-back mode.
摘要翻译： 根据示例实现，通用测试器包括在电测试操作模式期间连接到第一可插拔主机卡的主机接口插槽，以向被测试主机提供受压电信号。 在光学测试操作模式期间，主机接口插槽连接到第二可插拔主机卡，第二可插拔主机卡包括电光转换模块，用于将应力电信号转换为被提供给主机的应力光信号 测试。 压力发生器可以在直通模式或环回模式下操作。
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公开(公告)号：US08170829B1
公开(公告)日：2012-05-01
申请号：US12054361
申请日：2008-03-24
申请人： D. Brice Achkir , Matt Heston , Marco Mazzini
发明人： D. Brice Achkir , Matt Heston , Marco Mazzini
IPC分类号： G01P21/00
CPC分类号： H04L43/50
摘要： An apparatus for testing multiple Small Form-Factor Pluggable Plus (SFP+) ports comprising: a first testing module; a second testing module; and a communications link coupled with the first and the second testing modules; wherein each of the testing modules includes: a SFP+ interface connectable to a port under test (PUT), a signal processing circuit including: a signal compensator configured to perform signal compensation on a signal received from the other testing module, and a signal modifier configured to: modify the compensated signal according to a set of predetermined modification parameters, and transmit the modified signal to the PUT.
摘要翻译： 一种用于测试多个小型可插拔加密（SFP +）端口的装置，包括：第一测试模块; 第二个测试模块; 以及与第一和第二测试模块耦合的通信链路; 其中每个所述测试模块包括：可连接到被测端口（PUT）的SFP +接口，信号处理电路，包括：信号补偿器，被配置为对从所述另一测试模块接收的信号执行信号补偿;以及信号修改器， ：根据一组预定的修改参数修改补偿信号，并将修改的信号发送到PUT。
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