公开(公告)号：US20170336356A1

公开(公告)日：2017-11-23

申请号：US15520867

申请日：2015-10-21

Applicant: DH Technologies Development PTE Ltd.

Inventor： Thomas R Covey ,  Yang Kang ,  Frank Londry ,  Bradley B Schneider

IPC: G01N27/62 ,  H01J49/00 ,  H01J49/06 ,  H01J49/24

CPC classification number: G01N27/624 ,  H01J49/0031 ,  H01J49/004 ,  H01J49/04 ,  H01J49/06 ,  H01J49/24

Abstract: A sample analysis system having a continuous beam ion mobility filter incorporates an ion removal mechanism for removing residual ions from the ion mobility filter to reduce cross-talk. A sample to be analyzed by the sample analysis system can be entered into the continuous beam ion mobility filter, which filters the ions of the sample and passes the filtered group of ions to a detector or a mass analyzer (e.g., via an ion optics assembly disposed between the mass analyzer and the ion mobility filter), where some or all of the ions in the group are detected. The ion removal mechanism then removes all or a substantial portion of the residual ions from the ion mobility filter that are left over from the first filtered group before a second filtered group is passed through. In some aspects, the ion removal mechanism can be operated concurrent with an ion removal mechanism for removing residual ions from an ion optics assembly.