公开(公告)号：US20240312776A1

公开(公告)日：2024-09-19

申请号：US18681206

申请日：2022-08-03

Applicant: DH Technologies Development Pte. Ltd.

Inventor： Pavel RYUMIN ,  Nichols G. BLOOMFIELD ,  Igor CHERNUSHEVICH

IPC: H01J49/42 ,  H01J49/00 ,  H01J49/40

CPC classification number: H01J49/4265 ,  H01J49/0031 ,  H01J49/40 ,  H01J49/4215

Abstract: A mass spectrometer that includes a mass filter and a TOF mass analyzer receives the ion beam from an ion source device that ionizes a compound of a sample. The mass filter selects a precursor ion mass range and the mass analyzer mass analyzes the mass range. A continuous flow of selected precursor ions is maintained between the mass filter and the mass analyzer. A first set of parameters is applied to the mass spectrometer to produce a resolution above a first resolution threshold. A space charge effect is detected by determining if the measured TIC exceeds a TIC threshold or the measured resolution is less than the first resolution threshold. If a space charge effect is detected, at least one precursor ion transmission window with a width smaller than the mass range is applied to the ion beam by the mass filter and mass analyzed to reduce the space charge.