ELECTRON BEAM THROTTLING FOR ELECTRON CAPTURE DISSOCIATION

    公开(公告)号:US20210351026A1

    公开(公告)日:2021-11-11

    申请号:US17284336

    申请日:2019-10-08

    Abstract: In one aspect, an electron-ion reaction module, e.g., an electron capture dissociation module, for use in a mass spectrometer is disclosed, which comprises a chamber, an electron source for generating electrons and introducing the electrons into the chamber, a gate electrode positioned relative to the electron source and the chamber, and a DC voltage source operatively coupled to the gate electrode for applying control voltages to the gate electrode. The electron-ion interaction module can further include a controller operably coupled to the DC voltage source and configured for adjusting the DC voltage applied to the gate electrode to adjust flow of electrons into the chamber.

    Space Charge Reduction in TOF-MS
    2.
    发明公开

    公开(公告)号:US20240312776A1

    公开(公告)日:2024-09-19

    申请号:US18681206

    申请日:2022-08-03

    CPC classification number: H01J49/4265 H01J49/0031 H01J49/40 H01J49/4215

    Abstract: A mass spectrometer that includes a mass filter and a TOF mass analyzer receives the ion beam from an ion source device that ionizes a compound of a sample. The mass filter selects a precursor ion mass range and the mass analyzer mass analyzes the mass range. A continuous flow of selected precursor ions is maintained between the mass filter and the mass analyzer. A first set of parameters is applied to the mass spectrometer to produce a resolution above a first resolution threshold. A space charge effect is detected by determining if the measured TIC exceeds a TIC threshold or the measured resolution is less than the first resolution threshold. If a space charge effect is detected, at least one precursor ion transmission window with a width smaller than the mass range is applied to the ion beam by the mass filter and mass analyzed to reduce the space charge.

    Electron Emitter for an Ion Reaction Device of a Mass Spectrometer and Methods of Operating the Same

    公开(公告)号:US20250087474A1

    公开(公告)日:2025-03-13

    申请号:US18832984

    申请日:2023-01-24

    Abstract: Methods and systems for controlling a filament of an electron emitter associated with an ion reaction cell in accordance with various aspects of the present teachings may account for inter-filament and inter-instrument variability and can provide improved reproducibility in EAD experiments and ease of use. In some aspects, a method of operating an ion reaction device of a mass spectrometer system is provided. The method comprises applying a calibration drive voltage to a filament of an electron emitter associated with an ion reaction cell and determining a value representative of the calibration electron emission current generated by the filament while having the calibration drive voltage applied thereto. A calibration saturation voltage can be determined by iteratively increasing the calibration drive voltage applied to the filament and determining the value of the calibration electron emission current at each corresponding calibration drive voltage until the filament reaches a saturation condition.

    CHARGE STATE DETERMINATION OF A SINGLE ION DETECTION EVENT

    公开(公告)号:US20230335384A1

    公开(公告)日:2023-10-19

    申请号:US17925186

    申请日:2021-05-14

    Inventor: Pavel RYUMIN

    CPC classification number: H01J49/025

    Abstract: Methods and systems for identifying or classifying charge states of detected ions. An example method for classifying a charge state of detected ions may include generating a pulse for each ion in a plurality of ions detected by a detector, wherein each pulse has a pulse characteristic; generating a pulse-characteristic distribution of the generated pulses; and based on the pulse-characteristic distribution, generating an identification of the charge state of one or more ions in the plurality of ions.

    Electron-Based Fragmentation Method

    公开(公告)号:US20250029823A1

    公开(公告)日:2025-01-23

    申请号:US18569781

    申请日:2022-06-24

    Abstract: The present disclosure provides methods and systems for performing mass spectrometry in which at least two batches of precursor ions generated via ionization of at least two different portions of a sample are exposed to electron beams at different energies to cause fragmentation of at least a portion of the precursor ions. In some embodiments, the electron energies can be selected such at one of the electron energies, EIEIO fragmentation can occur while at the other electron energy, EIEO fragmentation channel is not available. The mass spectra corresponding to the two energies can then be utilized to generate a resultant mass spectrum in which mass peaks corresponding to ion fragments generated by EIEIO dissociation are more readily identifiable.

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