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1.发明申请公开(公告)号：US20160336161A1
公开(公告)日：2016-11-17
申请号：US15105089
申请日：2014-12-06
CPC分类号： H01J49/40 , H01J49/0031 , H01J49/025 , H01J49/20 , H01J49/22
摘要： Systems and methods are provided for time-of-flight analysis of a continuous beam of ions by a detector array. A sample is ionized using an ion source to produce a continuous beam of ions. An electric field is applied to the continuous beam of ions using an accelerator to produce an accelerated beam of ions. A rotating magnetic and/or electric field is applied to the accelerated beam to separate ions with different mass-to-charge ratios over an area of a two-dimensional detector using a deflector located between the accelerator and the two-dimensional detector. An arrival time and a two-dimensional arrival position of each ion of the accelerated beam are recorded using the two-dimensional detector. Alternatively, an electric field that is periodic with time is applied in order to sweep the accelerated beam over a periodically repeating path on the two-dimensional rectangular detector.
摘要翻译： 通过检测器阵列为连续的离子束进行飞行时间分析的系统和方法。 使用离子源离子化样品以产生连续的离子束。 使用加速器将电场施加到连续的离子束，以产生加速的离子束。 旋转的磁场和/或电场被施加到加速光束，以使用位于加速器和二维检测器之间的偏转器在二维检测器的区域上分离具有不同质量与电荷比的离子。 使用二维检测器记录加速光束的每个离子的到达时间和二维到达位置。 或者，施加周期性的电场，以便在二维矩形检测器上的周期性重复路径上扫描加速光束。
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公开(公告)号：US20180025898A1
公开(公告)日：2018-01-25
申请号：US15713416
申请日：2017-09-22
CPC分类号： H01J49/40 , H01J49/0031 , H01J49/025 , H01J49/20 , H01J49/22
摘要： Systems and methods are provided for time-of-flight analysis of a continuous beam of ions by a detector array. A sample is ionized using an ion source to produce a continuous beam of ions. An electric field is applied to the continuous beam of ions using an accelerator to produce an accelerated beam of ions. A rotating magnetic and/or electric field is applied to the accelerated beam to separate ions with different mass-to-charge ratios over an area of a two-dimensional detector using a deflector located between the accelerator and the two-dimensional detector. An arrival time and a two-dimensional arrival position of each ion of the accelerated beam are recorded using the two-dimensional detector. Alternatively, an electric field that is periodic with time is applied in order to sweep the accelerated beam over a periodically repeating path on the two-dimensional rectangular detector.
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