GRINDING APPARATUS AND GRINDING METHOD
    1.
    发明公开

    公开(公告)号:US20240238938A1

    公开(公告)日:2024-07-18

    申请号:US18391950

    申请日:2023-12-21

    CPC classification number: B24B41/005 B24B41/068 B24B51/00

    Abstract: Provided is a grinding apparatus including a holding unit that holds a workpiece by a chuck table, a grinding unit, a transporting mechanism that has a holding part capable of holding the workpiece, a first table that holds the workpiece to be loaded onto the holding unit, a second table that holds the workpiece having been unloaded from the holding unit, and a controller. When the controller determines that replacement of a grinding wheel is necessary in a state in which all of the holding unit, the first table, and the second table are holding workpieces, the controller makes the holding part of the transporting mechanism hold the workpiece held by the holding unit.

    HARD WAFER GRINDING METHOD
    3.
    发明申请

    公开(公告)号:US20230025120A1

    公开(公告)日:2023-01-26

    申请号:US17811969

    申请日:2022-07-12

    Abstract: A hard wafer grinding method includes a rough grinding step of forming a section along the diameter of a hard wafer into a centrally recessed shape by roughly grinding the hard wafer such that a central part of the hard wafer is thinner than a peripheral part of the hard wafer, a finish grinding step of expanding a ground area of the hard wafer from the peripheral part in an annular shape to the central part while dressing lower surfaces of finish grinding stones by the peripheral part of the hard wafer of the centrally recessed shape after the rough grinding, then setting the whole of a radius part of the hard wafer as the ground area, and further finish-grinding the hard wafer so as to obtain a predetermined thickness.

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