Memory cell array having continuous-strip field-oxide regions
    1.
    发明授权
    Memory cell array having continuous-strip field-oxide regions 失效
    具有连续带状场氧化物区域的存储单元阵列

    公开(公告)号:US5469383A

    公开(公告)日:1995-11-21

    申请号:US265349

    申请日:1994-06-24

    CPC分类号: H01L27/11521 H01L27/115

    摘要: A CMOS memory cell array and a method of forming it, which avoids problems caused by field oxide corner-rounding. A moat pattern defines alternating columns of active areas and field oxide regions. A source line pattern defines rows of source lines. Silicon dopant is implanted in areas not covered by the source line pattern to form buried n+ source lines. The field oxide regions are formed in areas not covered by the moat pattern. Subsequent fabrication steps may be in accordance with conventional CMOS fabrication techniques.

    摘要翻译: 一种CMOS存储单元阵列及其形成方法,其避免了由场氧化物四舍五入引起的问题。 护城河模式定义了活动区域和场氧化物区域的交替列。 源线模式定义了源行行。 将硅掺杂剂注入到未被源极线图案覆盖的区域中以形成埋入的n +源极线。 场氧化物区域形成在未被护套图案覆盖的区域中。 随后的制造步骤可以与传统的CMOS制造技术相一致。

    MOSFET cell array
    2.
    发明授权
    MOSFET cell array 失效
    MOSFET单元阵列

    公开(公告)号:US5365082A

    公开(公告)日:1994-11-15

    申请号:US954223

    申请日:1992-09-30

    摘要: A CMOS memory cell array, and a process for making it, that avoids problems caused by LOCOS isolation of cells. Moats are formed by etching away columns of a thick field oxide layer. The moats have two-tiered sidewalls, such that an upper tier is sloped, and a lower tier is more vertical. This approach provides the advantages of sloped sidewalls, but avoids filament problems. After the moats are formed, subsequent fabrication steps may be in accordance with conventional fabrication techniques for CMOS arrays.

    摘要翻译: CMOS存储器单元阵列及其制造方法,可以避免由于LOCOS隔离单元引起的问题。 通过蚀刻掉厚场氧化物层的柱形成护壁。 护城河具有双层侧壁,使得上层倾斜,并且较低层更垂直。 这种方法提供了倾斜侧壁的优点,但避免了灯丝问题。 在形成护城河之后,随后的制造步骤可以与CMOS阵列的常规制造技术相一致。

    CMOS memory cell array
    3.
    发明授权
    CMOS memory cell array 失效
    CMOS存储单元阵列

    公开(公告)号:US5350706A

    公开(公告)日:1994-09-27

    申请号:US954368

    申请日:1992-09-30

    CPC分类号: H01L27/11521 H01L27/115

    摘要: A CMOS memory cell array and a method of forming it, which avoids problems caused by field oxide corner-rounding. A moat pattern defines alternating columns of active areas and field oxide regions. A source line pattern defines rows of source lines. Silicon dopant is implanted in areas not covered by the source line pattern to form buried n+ source lines. The field oxide regions are formed in areas not covered by the moat pattern. Subsequent fabrication steps may be in accordance with conventional CMOS fabrication techniques.

    摘要翻译: 一种CMOS存储单元阵列及其形成方法,其避免了由场氧化物四舍五入引起的问题。 护城河模式定义了活动区域和场氧化物区域的交替列。 源线模式定义了源行行。 将硅掺杂剂注入到未被源极线图案覆盖的区域中以形成埋入的n +源极线。 场氧化物区域形成在未被护套图案覆盖的区域中。 随后的制造步骤可以与传统的CMOS制造技术相一致。