公开(公告)号：US06552410B1

公开(公告)日：2003-04-22

申请号：US09650773

申请日：2000-08-29

申请人： David D. Eaton ,  Ket-Chong Yap ,  Kevin K. Yee ,  E. Thomas Hart ,  Andrew K. Chan ,  Neal A. Palmer ,  Michael W. Dini ,  James Apland ,  Panawalge S. N. Gunaratna

发明人： David D. Eaton ,  Ket-Chong Yap ,  Kevin K. Yee ,  E. Thomas Hart ,  Andrew K. Chan ,  Neal A. Palmer ,  Michael W. Dini ,  James Apland ,  Panawalge S. N. Gunaratna

IPC分类号： H01L2200

CPC分类号： H03K19/1776 ,  H03K19/17732 ,  H03K19/17744

摘要： A programmable circuit, such as a field programmable gate array, and a dedicated device, such as an ASIC type device, are coupled together with an antifuse based interface on a single integrated circuit. A configurable non-volatile memory that communicates with the dedicated device is also located on the integrated circuit. The platform for the programmable circuit is one half of an existing programmable circuit, which eliminates the need to engineer the programmable circuit. The programmable circuit includes a clock network that receives clock signals from clock terminals as well as from a clock network in the dedicated device. The interface between the dedicated device and programmable circuit includes a number of conductors with buffers with testing circuitry. The testing circuitry includes a PMOS test transistor and a NMOS test transistor which permits testing of the buffers without programming the antifuses coupled to the conductors. The input/output terminals around the periphery and in the interface between the programmable circuit and dedicated device are tested using JTAG registers. The path of the test signal through the JTAG registers is selectable to pass around the periphery of both the programmable and dedicated devices or through the interface and around the periphery of only one of the programmable and dedicated devices.

摘要翻译： 诸如现场可编程门阵列的可编程电路以及诸如ASIC类型器件的专用器件在单个集成电路上与基于反熔丝的接口耦合在一起。 与专用设备通信的可配置非易失性存储器也位于集成电路上。 可编程电路的平台是现有可编程电路的一半，无需设计可编程电路。 可编程电路包括时钟网络，其从时钟端子以及专用器件中的时钟网络接收时钟信号。 专用器件和可编程电路之间的接口包括具有带测试电路的缓冲器的多个导体。 测试电路包括PMOS测试晶体管和NMOS测试晶体管，其允许对缓冲器进行测试而不编程耦合到导体的反熔丝。 使用JTAG寄存器测试周边和可编程电路与专用设备之间的接口中的输入/输出端子。 通过JTAG寄存器的测试信号的路径可选择通过可编程和专用设备的周边，或通过接口和仅可编程和专用设备之一的外围环绕。