公开(公告)号：US20060242498A1

公开(公告)日：2006-10-26

申请号：US10518743

申请日：2003-06-17

申请人： David Hamilton ,  Brian Stimpson ,  Mahmoud Bekheit

发明人： David Hamilton ,  Brian Stimpson ,  Mahmoud Bekheit

IPC分类号： G01R31/28

CPC分类号： G01R31/318342 ,  G01R31/3167 ,  G01R31/318371

摘要： A method of optimising a digital test signal for testing an analogue or mixed-signal circuit comprising determining a measure, for example a figure of merit, that is indicative of differences between the output of a fault free and the output of a known faulty circuit in response to an applied digital input signal. The digital input signal is then varied and another figure of merit is calculated for the fault free and the known faulty circuit for the new input signal. This is repeated a number of times, the digital input signal being varied each time. An optimum test signal is selected based on the determined figures of merit.

摘要翻译： 一种优化用于测试模拟或混合信号电路的数字测试信号的方法，包括确定例如品质因数的度量，其指示无故障的输出与已知故障电路的输出之间的差异 对应用的数字输入信号的响应。 然后，数字输入信号被改变，并为新的输入信号计算出无故障和已知故障电路的另一品质因数。 这是多次重复，数字输入信号每次都变化。 基于确定的品质因数来选择最佳测试信号。