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公开(公告)号:US20130335285A1
公开(公告)日:2013-12-19
申请号:US13527491
申请日:2012-06-19
申请人: David P. Tarkington , Michelle Rae Goldberg , Nicholas A. Rundle , Peter N. Jeziorek , Jonathan M. Haylock , Jerzy Guterman
发明人: David P. Tarkington , Michelle Rae Goldberg , Nicholas A. Rundle , Peter N. Jeziorek , Jonathan M. Haylock , Jerzy Guterman
CPC分类号: H05K9/00 , H01Q1/44 , H01Q1/48 , H01Q1/526 , H05K9/0015
摘要: Electronic devices may be provided with conductive structures such as displays and conductive housing walls. Conductive gaskets may be used to form electrical paths between opposing conductive structures in an electronic device. During device assembly, a conductive gasket may be compressed between opposing conductive structures. The conductive gasket may be formed from a conductive gasket wall structure. The conductive gasket wall structure may surround and at least partly enclose an air-filled cavity. Conductive gasket wall structures may be formed from conductive fabric, dielectric sheets coated with metal, or other conductive wall materials. The interior of a conductive gasket may be hollow and completely devoid of supporting structures or may contain internal structures for biasing the conductive gasket wall outwards. Planar gaskets and gaskets with other cross sections may be provided.
摘要翻译: 电子设备可以设置有导电结构,例如显示器和导电外壳壁。 导电垫圈可以用于在电子设备中的相对的导电结构之间形成电路径。 在器件组装期间,导电垫片可以在相对的导电结构之间被压缩。 导电垫片可以由导电垫圈壁结构形成。 导电垫圈壁结构可围绕并至少部分地包围充满空气的空腔。 导电垫圈壁结构可以由导电织物,涂覆有金属的电介质片或其它导电壁材料形成。 导电垫片的内部可以是中空的并且完全没有支撑结构,或者可以包含向内偏压导电垫圈壁的内部结构。 可以提供具有其他横截面的平面垫圈和垫圈。
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公开(公告)号:US09128118B2
公开(公告)日:2015-09-08
申请号:US13590963
申请日:2012-08-21
CPC分类号: G01R1/04 , G01R29/0821 , G01R31/01 , H04M1/24 , H05K9/0069
摘要: A test system may be provided in which devices under test are tested using radio-frequency test stations. A test station may include a test host, a test unit coupled to the test host, and a shielded enclosure. The shielded enclosure may contain a test antenna coupled to the test unit via a radio-frequency cable. A computer-controlled loading arm may be used to place a device under test on a positioner within the test enclosure. The test enclosure may have an enclosure door that is opened and closed using a computer-controlled pneumatic cylinder. When the enclosure door is closed, a portion of the enclosure door may actuate one or more levers on the positioner, which may in turn actuate one or more positioning arms to press the device under test against one or more guide surfaces on the positioner, thereby precisely positioning the device under test within the test enclosure.
摘要翻译: 可以提供一种测试系统,其中使用射频测试站测试被测设备。 测试台可以包括测试主机,耦合到测试主机的测试单元和屏蔽外壳。 屏蔽外壳可以包含经由射频电缆耦合到测试单元的测试天线。 可以使用计算机控制的装载臂将被测设备放置在测试机箱内的定位器上。 测试机箱可以具有使用计算机控制的气缸打开和关闭的外壳门。 当封闭门关闭时,外壳门的一部分可以致动定位器上的一个或多个杠杆,定位器可以依次致动一个或多个定位臂,以将定位器上的一个或多个引导表面按压被测试器件,由此 将测试设备内的测试箱精确地定位在测试中。
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公开(公告)号:US20140055147A1
公开(公告)日:2014-02-27
申请号:US13590963
申请日:2012-08-21
IPC分类号: G01R1/04
CPC分类号: G01R1/04 , G01R29/0821 , G01R31/01 , H04M1/24 , H05K9/0069
摘要: A test system may be provided in which devices under test are tested using radio-frequency test stations. A test station may include a test host, a test unit coupled to the test host, and a shielded enclosure. The shielded enclosure may contain a test antenna coupled to the test unit via a radio-frequency cable. A computer-controlled loading arm may be used to place a device under test on a positioner within the test enclosure. The test enclosure may have an enclosure door that is opened and closed using a computer-controlled pneumatic cylinder. When the enclosure door is closed, a portion of the enclosure door may actuate one or more levers on the positioner, which may in turn actuate one or more positioning arms to press the device under test against one or more guide surfaces on the positioner, thereby precisely positioning the device under test within the test enclosure.
摘要翻译: 可以提供一种测试系统,其中使用射频测试站测试被测设备。 测试台可以包括测试主机,耦合到测试主机的测试单元和屏蔽外壳。 屏蔽外壳可以包含经由射频电缆耦合到测试单元的测试天线。 可以使用计算机控制的装载臂将被测设备放置在测试机箱内的定位器上。 测试机箱可以具有使用计算机控制的气缸打开和关闭的外壳门。 当封闭门关闭时,外壳门的一部分可以致动定位器上的一个或多个杠杆,定位器可以依次致动一个或多个定位臂,以将定位器上的一个或多个引导表面按压被测试器件,由此 将测试设备内的测试箱精确地定位在测试中。
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