公开(公告)号：US06378173B1

公开(公告)日：2002-04-30

申请号：US09520814

申请日：2000-03-08

申请人： Dennis K. Ho ,  William Fenton

发明人： Dennis K. Ho ,  William Fenton

IPC分类号： E05D700

CPC分类号： E05D3/12 ,  E05D5/10 ,  E05D7/1005 ,  E05D15/507 ,  Y10T16/547 ,  Y10T16/549

摘要： A hinge apparatus consisting of a wire hinge, hinge bracket and cover bracket to provide a means for permitting the easy removal of a cover of a protective enclosure without its complete disengagement from the body of the enclosure. The hinge apparatus maintains the attachment of the cover to the main body of the protective enclosure without hindering access to the internal components within the enclosure.

摘要翻译： 铰链设备由线铰链，铰链支架和盖支架组成，以提供一种用于允许容易地移除保护性外壳的盖的装置，而不会完全脱离外壳的主体。 铰链装置保持盖子与保护壳体的主体的连接，而不妨碍对外壳内的内部部件的接近。

公开(公告)号：US06490694B1

公开(公告)日：2002-12-03

申请号：US09295224

申请日：1999-04-19

申请人： William Fenton ,  Patrick Nee

发明人： William Fenton ,  Patrick Nee

IPC分类号： H02H305

CPC分类号： G11C29/48 ,  G01R31/2853 ,  G06F11/2733

摘要： A method and apparatus for use with an electronic test system to enable the direct testing of buses on a unit under test (UUT). A connection and interface for an electronic test system are provided, which are simple to use, fast to connect and reliable, which may be used as an extra point of test and/or for testing buses remote from the microprocessor of a circuit under test, and which may also be used independently of any devices of the circuit under test. The test apparatus and method may be used to test buses remote from the microprocessor without the use of peripheral devices on the circuit under test, for example I/O chips.

摘要翻译： 一种与电子测试系统一起使用以便在被测单元（UUT）上直接测试总线的方法和装置。 提供了一种用于电子测试系统的连接和接口，其易于使用，快速连接和可靠，其可以用作额外的测试点和/或用于测试远离被测电路的微处理器的总线， 并且还可以独立于被测电路的任何装置使用。 测试装置和方法可用于在远离微处理器的情况下测试总线，而不需要在被测电路上使用外围设备，例如I / O芯片。

公开(公告)号：USD455166S1

公开(公告)日：2002-04-02

申请号：US29126101

申请日：2000-07-11

申请人： Elie-Jean Raad ,  Roman P. Rak ,  William Fenton

设计人： Elie-Jean Raad ,  Roman P. Rak ,  William Fenton

公开(公告)号：US06842865B2

公开(公告)日：2005-01-11

申请号：US09797174

申请日：2001-02-27

申请人： Patrick Nee ,  William Fenton ,  Ciaran Harvey ,  Malcolm Simmonds

发明人： Patrick Nee ,  William Fenton ,  Ciaran Harvey ,  Malcolm Simmonds

IPC分类号： G06F11/26 ,  G06F11/00

CPC分类号： G06F11/261

摘要： A test system and method for testing a processor circuit board having at least one processor. The system includes a processor control circuit connected to the processor circuit board which enables test routines to be run on the processor of the processor circuit board, a peripheral emulator circuit, having a connector for connecting to at least one peripheral connector on the processor circuit board, for emulating at least one function of at least one peripheral device, a response circuit measuring the response of the processor circuit board to a test routine, a main controller in electronic communication with the processor control circuit and the response circuit. In operation, the processor control circuit receives instructions from the main controller and causes the processor on the processor circuit board to run a test routine. The response circuit will then communicate the results of the test routine to the main controller.

摘要翻译： 一种用于测试具有至少一个处理器的处理器电路板的测试系统和方法。 该系统包括连接到处理器电路板的处理器控制电路，其使测试程序能够在处理器电路板的处理器上运行，外围仿真器电路具有用于连接到处理器电路板上的至少一个外围连接器的连接器 ，用于模拟至少一个外围设备的至少一个功能;响应电路，测量所述处理器电路板对测试例程的响应;与所述处理器控制电路进行电子通信的主控制器和所述响应电路。 在操作中，处理器控制电路从主控制器接收指令，并使处理器电路板上的处理器运行测试程序。 然后响应电路将测试例程的结果传达给主控制器。

公开(公告)号：US4461347A

公开(公告)日：1984-07-24

申请号：US228739

申请日：1981-01-27

申请人： Howard M. Layton ,  William Fenton

发明人： Howard M. Layton ,  William Fenton

IPC分类号： F28D7/10 ,  F28F19/04 ,  F24H1/20 ,  H05B3/82

CPC分类号： F28F19/04 ,  F28D7/106 ,  Y10S138/03

摘要： A heat exchange assembly for raising a process fluid, such as ultra-pure, de-ionized water, to an elevated temperature without adversely affecting the quality thereof includes coaxially-arranged inner and outer pipes, the annular space therebetween defining a flow passage for the fluid to be heated. The inner pipe is formed of high-strength metal of good thermal conductivity and encloses a heat source, such as steam, circulating heated fluid or an electric heater. The inner pipe is ensheathed by an extruded heat-shrinkable plastic tube of non-reactive material, such as PTFE or polypropylene not exceeding 7 mils in thickness, which is shrunk-fit thereon to form one wall of the flow passage. The opposing wall of the passage is formed by the interior surface of the outer pipe which is also constituted by non-reactive plastic material such as PTFE or polypropylene. Terminations comprising all-plastic unions are provided at the ends of the inner and outer pipes to couple the passageway to inlet and outlet fitting for the process fluid. The outer pipe may be reinforced by a braided outer sleeve.

摘要翻译： 用于将过程流体例如超纯的去离子水升高到高温而不会不利地影响其质量的热交换组件包括同轴布置的内管和外管，其间的环形空间限定用于 要加热的液体 内管由具有良好导热性的高强度金属形成，并且包围热源，例如蒸汽，循环加热流体或电加热器。 内管由非反应性材料的挤出热收缩塑料管（例如聚四氟乙烯或不超过7密耳厚度的聚丙烯）接合，其被收缩配合在其上以形成流动通道的一个壁。 通道的相对壁由外管的内表面形成，其也由诸如PTFE或聚丙烯的非反应性塑料材料构成。 包括全塑性接头的终端设置在内管和外管的端部，以将通道连接到工艺流体的入口和出口接头。 外管可以通过编织的外套筒来加强。