Test pattern selection method for OPC model calibration
    1.
    发明授权
    Test pattern selection method for OPC model calibration 有权
    OPC模型校准的测试模式选择方法

    公开(公告)号:US08677288B2

    公开(公告)日:2014-03-18

    申请号:US13594492

    申请日:2012-08-24

    IPC分类号: G06F17/50

    CPC分类号: G03F1/36

    摘要: A block management method for OPC model calibration includes calculating differences in several different optical functions between first patterns of a first mask and patterns of a second mask corresponding to the first patterns but differing therefrom by a predetermined bias, selecting one or more of the optical functions based on the calculated differences, clustering data of variations in the values of the calculated differences in the selected ones of the optical functions, selecting respective ones of the first patterns in consideration of how the data clusters, and designating the selected first patterns as test patterns.

    摘要翻译: 用于OPC模型校准的块管理方法包括:计算第一掩模的第一图案与对应于第一图案但与之不同的第二掩模的图案之间的若干不同光学功能的差异,并且通过预定偏置不同,选择光学功能中的一个或多个 基于所计算出的差异,对所选择的光学功能中计算出的差异的值的变化进行聚类数据,考虑数据簇的选择并选择所选择的第一图案作为测试图案 。