Abstract:
In one embodiment, a digital X-ray detector is provided with a plurality of pixel regions. Each pixel region includes a first photodiode having a first area and a second photodiode having a second area equal to or smaller than the first area. The digital X-ray detector also includes a shielding structure that overlies the first and second photodiodes of each pixel region with the shielding structure shielding proportionally less of the first photodiode than of the second photodiode to provide the first photodiode with a first sensitivity and the second photodiode with a second sensitivity lower than the first sensitivity.
Abstract:
In one embodiment, a digital X-ray detector is provided with a plurality of pixel regions. Each pixel region includes a first photodiode having a first area and a second photodiode having a second area equal to or smaller than the first area. The digital X-ray detector also includes a shielding structure that overlies the first and second photodiodes of each pixel region with the shielding structure shielding proportionally less of the first photodiode than of the second photodiode to provide the first photodiode with a first sensitivity and the second photodiode with a second sensitivity lower than the first sensitivity.
Abstract:
In one aspect of the invention a method for processing a fluoroscopic image is provided. The method includes scanning an object with an imaging system including at least one radiation source and at least one detector array, acquiring a plurality of dark images to generate a baseline image, acquiring a plurality of lag images subsequent to the baseline image, determining a plurality of parameters of a power law using at least one lag image and at least one baseline image, and performing a log—log extrapolation of the power law including the determined parameters.
Abstract:
Systems, methods and apparatus are provided through which a collimator has one or more varying physical characteristics that have the effect of varying the absorption of electromagnetic energy from a low extent of absorption at a leading edge to the same extent of absorption as the remainder of the collimator. In some embodiments, the collimator has a tapered knife-edge. The varying absorption of electromagnetic energy at different points along the collimator reduce abrupt transitions of projection of the electromagnetic energy onto an electromagnetic energy detector, thereby reducing erroneous artifacts in an image generated by the detector.
Abstract:
A method for processing X-ray image data includes exposing a digital detector to X-ray radiation. The method also includes sampling data via the digital detector including X-ray image data and offset image data. The method further includes calculating an average offset image without prior knowledge of a total number of offset image frames sampled.
Abstract:
A gain correction and calibration technique for digital imaging systems is provided. In one embodiment, a method may include acquiring a plurality of dark images via a digital detector of an X-ray system. Acquiring the plurality of dark images may include acquiring data from a plurality of data channels of the digital detector during an analog test mode of the digital detector in which calibration voltages are applied to the data channels. The method may also include calibrating a channel gain map of the detector based on the plurality of dark images. Additional systems, methods, and devices are also disclosed.
Abstract:
Systems and methods for performing schema matching of multiple data dictionaries. Lexical graphs are generated for two or more data dictionaries. The lexical graphs include terms with definitions and identified links between terms. A data processing device determines if matches occur between the generated lexical graphs and outputs the result of the determination.
Abstract:
Systems and methods are provided for offset correction of images from a flat panel detector. In some embodiments, the apparatus and method develops one or more offset maps, acquired during system idle, for the imaging system at a plurality of exposure windows. In some embodiments, exposure parameters acquired for the imaging system before image acquisition are used to select an offset map to subtract from subsequent X-ray images. In some further embodiments, executable instructions are disclosed for directing a processor to compile one or more offset map and exposure parameters to subtract based on a selected offset map noise elements from X-ray images and thereby minimizing the time between image acquisition and display of processed images.
Abstract:
A technique for selectively processing data from a digital detector includes determining an image area produced by orientation of a radiation source assembly. The assembly may include a radiation source and a collimator, which may be separately orientable. The image area is computed based upon the orientation of the radiation source assembly that projects a radiation beam towards an imaging plane. Image data from a detector within the imaging plane is selectively processed to improve computational efficiency. The system may also determine whether the image area falls within the imaging surface of the detector and inform an operator or inhibit an exposure if such is not the case.
Abstract:
A detector imaging system having an apparatus and method for correcting defective pixels in a current acquired image is disclosed herein. The system performs the correction of defective pixels using image feature information and temporal information. The system includes a correction scheme which includes determining a temporal matrix based on the current acquired image, at least one prior acquired image, and a filter weight; determining a local gradient based in part on the temporal matrix and a gradient kernel; and providing a correction value based on the local gradient to correct the defective pixel. The correction scheme is repeated a plurality of times as desired to correct all the defective pixels in the current acquired image.