Processes and apparatus for variable binning of data in non-destructive imaging
    5.
    发明授权
    Processes and apparatus for variable binning of data in non-destructive imaging 有权
    用于非破坏性成像中数据可变合并的过程和设备

    公开(公告)号:US07272207B1

    公开(公告)日:2007-09-18

    申请号:US11389271

    申请日:2006-03-24

    IPC分类号: H05G1/58

    摘要: Systems, processes and apparatus are described through which non-destructive imaging is achieved, including a process for variable binning of detector elements. The process includes accepting input data indicative of image quality goals and descriptors of an imaging task, as well as parameters characterizing a test subject, relative to non-destructive imaging of an internal portion of the test subject and determining when the non-destructive imaging system is capable of achieving the image quality goals using binning of more than four pixels.

    摘要翻译: 描述了实现非破坏性成像的系统,过程和装置,包括用于检测器元件的可变合并的过程。 该过程包括相对于测试对象的内部部分的非破坏性成像接收指示成像任务的图像质量目标和描述符的输入数据以及表征测试对象的参数,并且确定何时非破坏性成像系统 能够使用超过四个像素的合并来实现图像质量目标。

    Spatially patterned light-blocking layers for radiation imaging detectors
    7.
    发明授权
    Spatially patterned light-blocking layers for radiation imaging detectors 有权
    用于辐射成像检测器的空间图案遮光层

    公开(公告)号:US07081628B2

    公开(公告)日:2006-07-25

    申请号:US10705091

    申请日:2003-11-10

    IPC分类号: G01T1/24

    摘要: Spatially patterned light-blocking layers for radiation imaging detectors are described. Embodiments comprise spatially patterned light-blocking layers for an amorphous silicon flat panel x-ray detector, wherein the spatially patterned light-blocking layer blocks light from a predetermined number of switching elements in the detector, wherein the predetermined number comprises less than all of the switching elements in the detector. These light-blocking layers may block light from each switching element in a predetermined arrangement of switching elements that are read out last, or in any other suitable pattern.

    摘要翻译: 描述了用于辐射成像检测器的空间图案遮光层。 实施例包括用于非晶硅平板X射线检测器的空间图案化阻光层,其中空间图案化阻光层阻挡来自检测器中预定数量的开关元件的光,其中预定数量包括小于全部 检测器中的开关元件。 这些遮光层可以以最后读出的开关元件的预定布置或以任何其它合适的图案阻挡来自每个开关元件的光。