公开(公告)号：US20170003195A1

公开(公告)日：2017-01-05

申请号：US15193180

申请日：2016-06-27

Applicant: EXFO INC.

Inventor： Denis LAFRANCE ,  Bernard RUCHET ,  Robert BARIBAULT

IPC: G01M11/00 ,  G02B21/00 ,  H04B10/00 ,  G02B6/38 ,  G06T7/00 ,  H04N5/225

CPC classification number: G01M11/30 ,  G02B6/385 ,  G02B6/3885 ,  G02B21/0016 ,  G06T7/0004 ,  G06T2207/10056 ,  H04B10/12 ,  H04N5/2251 ,  H04N2005/2255

Abstract: An inspection system for inspecting a multiple-fiber connector is provided. The inspection system includes a microscope probe and a probe tip configured to provide an optical path between the microscope probe and the multiple-fiber connector. The probe tip and microscope probe are configured so that the field of view of the microscope probe is sufficiently large to cover a portion of the connector surface encompassing a plurality of the optical fiber endfaces. The system further includes a shifting mechanism operable to shift the field of view of the microscope probe between at least two discrete positions over the connector surface. Each discrete position encompasses a different subset of the multiple optical fiber endfaces and optionally at least one positioning reference. A probe tip and a method of inspection are also provided.

Abstract translation: 提供了一种用于检查多光纤连接器的检查系统。 检查系统包括显微镜探针和探针尖端，其构造成在显微镜探针和多光纤连接器之间提供光路。 探针头和显微镜探针被配置成使得显微镜探针的视野足够大以覆盖包围多个光纤端面的连接器表面的一部分。 该系统还包括一个移动机构，可操作以将显微镜探针的视场在连接器表面上的至少两个离散位置之间移动。 每个离散位置包括多个光纤端面的不同子集以及可选地至少一个定位参考。 还提供探针尖端和检查方法。