公开(公告)号：US20240255713A1

公开(公告)日：2024-08-01

申请号：US18420965

申请日：2024-01-24

Applicant: EXFO Inc.

Inventor： Olivier COTE ,  Jean Filion ,  Raphael LABERGE

IPC: G02B6/38

CPC classification number: G02B6/3898 ,  G02B6/3825 ,  G02B6/385

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging two non-parallel APC optical-fiber endfaces of a duplex (i.e., APC trans-duplex) optical-fiber connector. Because the two optical-fiber endfaces of an APC trans-duplex connector are angled-polished (APC) in different directions (non-parallel), inspection light reflected on the two endfaces take diverging pathways. A single-fiber or multi-fiber inspection microscope therefore cannot allow inspection of both optical-fiber endfaces at once. The proposed adapter tip or microscope system comprises relay optics defining two imaging paths (one for each optical-fiber endface), wherein each imaging path comprises at least one optical component (e.g., an optical prism) used to deviate inspection light from each endface towards the optical axis of the objective lens, such that both endfaces may be imaged within the field of view of the inspection microscope.

公开(公告)号：US20230367082A1

公开(公告)日：2023-11-16

申请号：US18310861

申请日：2023-05-02

Applicant: EXFO Inc.

Inventor： Olivier COTE ,  Mario L'HEUREUX ,  Raphael LABERGE

IPC: G02B6/38 ,  G02B21/00

CPC classification number: G02B6/385 ,  G02B6/3825 ,  G02B6/3853 ,  G02B21/0016 ,  G02B21/0008

Abstract: There is provided an adapter tip to be employed with an optical-fiber connector-endface inspection microscope device and an optical-fiber connector endface inspection microscope system suitable for imaging the endface of a duplex optical-fiber connector. Because of the distance between the ferrules of a duplex connector, the field of view of a typical single-fiber or multi-fiber inspection microscope may not be wide enough to allow inspection of both ferrules at once. The proposed adapter tip or microscope system may comprise relay optics configured to laterally shift the optical path of the light beam reflected from one optical fiber endface (corresponding the first ferrule) toward that from the other optical fiber endface (corresponding the second ferrule), so that both endfaces may be imaged within the field of view of the inspection microscope.