公开(公告)号：US20140203191A1

公开(公告)日：2014-07-24

申请号：US14160135

申请日：2014-01-21

申请人： FEI Company

发明人： Bart Buijsse ,  Linda Francina van Driel

IPC分类号： G01N21/64

CPC分类号： G02B21/082 ,  G01N21/6458 ,  G02B21/16

摘要： The invention relates to a method of inspecting parts of a sample on a TEM grid with a fluorescence microscope, as arises when performing correlative microscopy, more specifically for samples on a holey carbon grid. A problem occurs when imaging vitrified ice with sample material when the ice is heated by the light used. The invention is based on the insight that the absorption in the carbon support film is responsible for the heating, as ice hardly absorbs light. By localizing the illumination of the fluorescent microscope to the parts of the sample that are above a hole in the carbon, heating of the ice is lowered. The localization can be achieved by, for example, passing the light through a LCD type Spatial Light Modulator.

摘要翻译： 本发明涉及一种利用荧光显微镜在TEM网格上检测样品的部分的方法，如进行相关显微镜时更为具体地用于多孔碳网格上的样品。 当冰被所用的光加热时，用样品材料成像玻璃化冰时会出现问题。 本发明是基于以下认识：碳载体膜中的吸收负责加热，因为冰难以吸收光。 通过将荧光显微镜的照明定位在碳上方的孔的上方的样品部分，冰的加热降低。 定位可以通过例如使光通过LCD型空间光调制器来实现。