公开(公告)号：US08785232B2

公开(公告)日：2014-07-22

申请号：US13945583

申请日：2013-07-18

Applicant: First Solar, Inc.

Inventor： Gang Xiong ,  Rick C. Powell ,  Aaron Roggelin ,  Kuntal Kumar ,  Arnold Allenic ,  Kenneth M. Ring ,  Charles E. Wickersham

IPC: H01L21/00

CPC classification number: H01L31/02963 ,  H01L31/073 ,  Y02E10/543 ,  Y02P70/521

Abstract: A method to improve CdTe-based photovoltaic device efficiency is disclosed. The CdTe-based photovoltaic device can include oxygen or silicon in semiconductor layers.

Abstract translation: 公开了一种改善CdTe基光伏器件效率的方法。 CdTe基光伏器件可以包括半导体层中的氧或硅。

公开(公告)号：US20130298992A1

公开(公告)日：2013-11-14

申请号：US13945583

申请日：2013-07-18

Applicant: First Solar, Inc.

Inventor： Gang Xiong ,  Rick C. Powell ,  Aaron Roggelin ,  Kuntal Kumar ,  Arnold Allenic ,  Kenneth M. Ring ,  Charles E. Wickersham

IPC: H01L31/0296

CPC classification number: H01L31/02963 ,  H01L31/073 ,  Y02E10/543 ,  Y02P70/521

Abstract: A method to improve CdTe-based photovoltaic device efficiency is disclosed. The CdTe-based photovoltaic device can include oxygen or silicon in semiconductor layers.

Abstract translation: 公开了一种改善CdTe基光伏器件效率的方法。 CdTe基光伏器件可以包括半导体层中的氧或硅。

公开(公告)号：US20130206738A1

公开(公告)日：2013-08-15

申请号：US13761797

申请日：2013-02-07

Applicant: FIRST SOLAR, INC.

Inventor： Charles E. Wickersham

IPC: B23K26/38 ,  G01R27/26

CPC classification number: B23K26/38 ,  B23K26/361 ,  B23K26/40 ,  B23K2103/50 ,  H01L31/0463 ,  H01L31/18 ,  Y02E10/50

Abstract: Real time monitoring and detection of the depths of laser scribes used during pulsed laser ablation processes. During a laser scribing process, sensors are used to determine in real time an amount of ablated material from a substrate undergoing the process. Laser scribing can be terminated when the amount of ablated material as detected by the sensors corresponds to a desired scribe depth.

Abstract translation: 实时监测和检测在脉冲激光烧蚀过程中使用的激光划片的深度。 在激光划线过程中，使用传感器来实时地确定来自正在进行该工艺的衬底的消融材料的量。 当由传感器检测到的消融材料的量对应于所需的划痕深度时，可以终止激光划线。