公开(公告)号：US20220236304A1

公开(公告)日：2022-07-28

申请号：US17587898

申请日：2022-01-28

Applicant: FormFactor, Inc.

Inventor： Sterling Tadashi Collins ,  Jason William Cosman ,  Lich Thanh Tran ,  Vinh-Lam Olivier Buu

IPC: G01R1/073

Abstract: Vertical probe arrays having angled guide plates are provided. With this configuration, the probes can be straight conductors (when mechanically undeformed) and the mechanical bias provided by the angled guide plates can ensure the probes have a well-defined deformation when the probe array make contact to the device under test. This allows the use of straight conductors as probes without suffering from probe shorting and mechanical interference caused by straight probes buckling in unpredictable directions when vertically compressed.

公开(公告)号：US20240345133A1

公开(公告)日：2024-10-17

申请号：US18634655

申请日：2024-04-12

Applicant: FormFactor, Inc.

Inventor： Sterling Tadashi Collins ,  Vinh-Lam Olivier Buu ,  Kevin John Hughes

IPC: G01R1/073

CPC classification number: G01R1/07314

Abstract: A roller mechanism with controlled height is used for probe tap-down in arrays of vertical probes for device testing. The height can be controlled using features of the roller, or external shims. This approach overcomes issues related to guide plate flexure during plate tap down by reducing forces on guide plates. It also avoids issues of probe damage from manual tap down.