Testing system interconnections using dynamic configuration and test
generation
    1.
    发明授权
    Testing system interconnections using dynamic configuration and test generation 失效
    使用动态配置和测试生成测试系统互连

    公开(公告)号:US5617430A

    公开(公告)日:1997-04-01

    申请号:US171492

    申请日:1993-12-22

    CPC分类号: G01R31/31855 G01R31/041

    摘要: An electronics systems having variable interconnections among major components is tested by dynamically identifying the locations and types of all system components at the time the test is to be performed, for building a global model describing the interconnections among these components. Specific tests appropriate for this model are then dynamically generated and executed. Data on the components themselves identifies them. The tests employ boundary-scanning techniques to locate failing drivers, receivers, and bidirectional driver/receivers, as well as open and shorted interconnections.

    摘要翻译: 在主要组件之间具有可变互连的电子系统通过在执行测试时动态地识别所有系统组件的位置和类型来测试,以构建描述这些组件之间的互连的全局模型。 然后动态生成并执行与该模型相适应的特定测试。 组件上的数据本身标识它们。 这些测试采用边界扫描技术来定位故障驱动器,接收器和双向驱动器/接收器,以及开放和短路互连。