Industrial Tool
    4.
    发明申请
    Industrial Tool 审中-公开
    工业工具

    公开(公告)号:US20120169485A1

    公开(公告)日:2012-07-05

    申请号:US13337199

    申请日:2011-12-26

    申请人: Martin Eckert

    发明人: Martin Eckert

    IPC分类号: G08C19/12

    CPC分类号: B25B21/00 B25B23/14 B25F5/00

    摘要: An industrial and electrically driven tool includes two mutually independent radio modules so that a redundant communication link to a controller can be set up.

    摘要翻译: 工业和电动工具包括两个相互独立的无线电模块,使得可以建立到控制器的冗余通信链路。

    Test fail analysis on VLSI chips
    5.
    发明授权
    Test fail analysis on VLSI chips 失效
    VLSI芯片测试故障分析

    公开(公告)号:US08180142B2

    公开(公告)日:2012-05-15

    申请号:US12326166

    申请日:2008-12-02

    IPC分类号: G06K9/03

    CPC分类号: G06T7/001 G06T2207/30148

    摘要: Compact graphical representations of common test fail signatures and process related test fails are provided through methods of selecting, calculating and/or presenting information. The input may be a list of failing tests on a sample of devices under test from chip and/or wafer process fails. The failing tests are identified and then other tests that fail at the same time may be identified. Several graphical outputs are provided, including all possible combinations between test fails and between test fails and process fails. The dependencies are printed as sorted two dimensional bitmaps that are compact representations of the results using color codes. Subtraction of two independent bitmaps is provided, which eliminates common properties and emphasizes differences between multiple bitmaps which allows for quick identification of differences of process fails potentially different between the two different bitmaps indicating potential root causes for the selected one of the test fails.

    摘要翻译: 通过选择,计算和/或呈现信息的方法提供常见测试失败签名和过程相关测试失败的紧凑图形表示。 输入可以是从芯片和/或晶片处理失败的被测器件的样本的失败测试的列表。 确定失败的测试,然后可以确定同时失败的其他测试。 提供了几个图形输出,包括测试失败和测试失败和进程失败之间的所有可能的组合。 依赖关系作为排序的二维位图打印,这些位图是使用颜色代码的结果的紧凑表示。 提供了两个独立位图的减法,这消除了通用属性,并且强调了多个位图之间的差异,这允许快速识别两个不同位图之间的差异的过程失败,这两个不同的位图表示所选择的一个测试失败的潜在根本原因。