公开(公告)号：US09823889B2

公开(公告)日：2017-11-21

申请号：US14648713

申请日：2013-01-08

Applicant: Freescale Semiconductor, Inc.

Inventor： Robert Krutsch ,  Laurent Emmerich

IPC: G06T15/20 ,  G06F3/14 ,  G06F3/147 ,  B60K37/02 ,  G06T15/00

CPC classification number: G06F3/1431 ,  B60K37/02 ,  G06F3/147 ,  G06T15/005 ,  G06T15/20 ,  G06T2215/16

Abstract: A method of estimating a fragment count for the display of at least one three-dimensional (3D) object. The method comprises determining an ellipsoid representative of a set of vertices defined by coordinates of the at least one 3D object, applying a transformation to the ellipsoid, calculating a projection area of the transformed ellipsoid, and estimating the fragment count for the display of the 3D object based at least partly on the calculated projection area of the transformed ellipsoid.