公开(公告)号：US20240409378A1

公开(公告)日：2024-12-12

申请号：US18273965

申请日：2022-01-25

Applicant: GEICO S.p.A.

Inventor： Daniel RASPONE ,  Valerio IGLIO

IPC: B66F9/06 ,  B62D65/18 ,  B66F9/20

Abstract: A transport system for an industrials plant may include: at least one trolley configured to autonomously transport an object; at least one skid configured to support the object; and at least one station configured to load the at least one skid onto the at least one trolley and configured to unload the at least one skid off of the at least one trolley. The at least one trolley may include: a motorized handling platform; a motorized lifting system; and a roller table equipped with first rollers. The roller table may be supported on the motorized lifting system so as to move on command between a raised position and a lowered position on the at least one trolley. The roller table may be configured to support the at least one skid resting on the first rollers.

公开(公告)号：US20210255117A1

公开(公告)日：2021-08-19

申请号：US17251750

申请日：2019-06-11

Applicant: GEICO S.p.A.

Inventor： Paolo COLOMBAROLI ,  Daniel RASPONE ,  Bruno DE NISCO ,  Alessandro DI GIROLAMO

IPC: G01N21/95 ,  G01N21/88

Abstract: A method for localizing defects on a complex surface of an object may include: realizing an acquisition assembly with an electromagnetic wave emission device and an optoelectronic device for detecting electromagnetic waves reflected by the complex surface; defining a scan path at a distance from the complex surface; and during a defect search procedure: moving the acquisition assembly along the path; defining instants during the moving of the acquisition assembly at which the acquisition assembly acquires an image of the complex surface as a two-dimensional pixel matrix of the optoelectronic device; storing consecutive two-dimensional pixel matrices obtained along the path; storing coordinates of the acquisition assembly along the scan path and associating the coordinates with respective two-dimensional matrices of the consecutive two-dimensional pixel matrices; locating detects in the consecutive two-dimensional pixel matrices; and/or determining spatial coordinates of the defects detected in the matrix using a linear or linearizable transformation.