RANKING DEFECTS WITH YIELD IMPACTS
    1.
    发明申请

    公开(公告)号:US20180238958A1

    公开(公告)日:2018-08-23

    申请号:US15440791

    申请日:2017-02-23

    CPC classification number: G01R31/2851 G06F7/556 G06F17/16

    Abstract: Failure types that caused defective items to fail testing are identified, the defective items are grouped by the failure types to produce failure-type groups, and the defective items are analyzed to identify defect types that caused the failures. Failure-type limited yield within each of the failure-type groups, and failure-type group-specific defect ratio based on proportions of the defect types within each of the failure-type groups are determined. Additionally, each failure-type group-specific defect ratio is weighted using the failure-type limited yield to produce a weighted failure-type group-specific defect limited yield. For each of the defect types, the weighted failure-type group-specific defect limited yield from each of the failure-type groups is combined to produce the failure-type influenced defect-type total limited yield. Matrix processing is used for the weighting and combination processes. The defect types are ranked based on the failure-type influenced defect-type total limited yield.

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