公开(公告)号：US08869077B1

公开(公告)日：2014-10-21

申请号：US13901164

申请日：2013-05-23

Applicant: GLOBALFOUNDRIES Inc.

Inventor： Rani Ghaida ,  Swamy Muddu

IPC: G06F17/50

CPC classification number: G06F17/5081 ,  G06F2217/12 ,  Y02P90/265

Abstract: Methodologies and an apparatus enabling an improvement of a manufacturing yield of an IC design are disclosed. Embodiments include: determining a portion of a layout of an IC design, the portion including a first pattern including a plurality of design connections; determining a function performed by the first pattern based, at least in part, on the design connections; and selecting, by a processor, a second pattern based on the function.

Abstract translation: 公开了能够提高IC设计的制造成品率的方法和装置。 实施例包括：确定IC设计的布局的一部分，该部分包括包括多个设计连接的第一图案; 至少部分地基于所述设计连接来确定由所述第一图案执行的功能; 以及基于所述功能，由处理器选择第二模式。