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公开(公告)号:US20210384297A1
公开(公告)日:2021-12-09
申请号:US16893855
申请日:2020-06-05
Applicant: GLOBALFOUNDRIES U.S. INC.
IPC: H01L29/08 , H01L29/737 , H01L29/417 , H01L29/66
Abstract: The present disclosure relates to semiconductor structures and, more particularly, to heterojunction bipolar transistors and methods of manufacture. The structure includes: a first semiconductor layer including a device region; a second semiconductor layer under the first semiconductor layer; a layer of conductive material between the first semiconductor layer and the second semiconductor layer; at least one contact extending to and contacting the layer of conductive material; and a device in the device region above the layer of conductive material.