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公开(公告)号:US20210384297A1
公开(公告)日:2021-12-09
申请号:US16893855
申请日:2020-06-05
Applicant: GLOBALFOUNDRIES U.S. INC.
IPC: H01L29/08 , H01L29/737 , H01L29/417 , H01L29/66
Abstract: The present disclosure relates to semiconductor structures and, more particularly, to heterojunction bipolar transistors and methods of manufacture. The structure includes: a first semiconductor layer including a device region; a second semiconductor layer under the first semiconductor layer; a layer of conductive material between the first semiconductor layer and the second semiconductor layer; at least one contact extending to and contacting the layer of conductive material; and a device in the device region above the layer of conductive material.
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公开(公告)号:US20240006524A1
公开(公告)日:2024-01-04
申请号:US17852873
申请日:2022-06-29
Applicant: GLOBALFOUNDRIES U.S. Inc.
Inventor: Mark D. LEVY , Qizhi LIU , Jeonghyun HWANG
IPC: H01L29/778 , H01L29/20 , H01L29/66
CPC classification number: H01L29/7786 , H01L29/2003 , H01L29/66462
Abstract: The present disclosure relates to semiconductor structures and, more particularly, to a patterned buried porous layer of semiconductor material and a device over the patterned buried porous layer, and methods of manufacture. The structure includes: a semiconductor substrate includes a patterned buried porous layer within the semiconductor substrate; a semiconductor compound material over the semiconductor substrate and the patterned buried porous layer; and at least one device on the semiconductor compound material. The non-patterned portions of the semiconductor substrate provide a thermal pathway within the semiconductor substrate.
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