公开(公告)号：US11164795B2

公开(公告)日：2021-11-02

申请号：US16828273

申请日：2020-03-24

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Sipeng Gu ,  Judson Holt ,  Haiting Wang ,  Bangun Indajang

IPC: H01L21/8238 ,  H01L27/092 ,  H01L29/10 ,  H01L29/08

Abstract: Structures for a field-effect transistor and methods of forming a structure for a field-effect transistor. First and second gate structures extend over the semiconductor body. A source/drain region is positioned laterally between the first gate structure and the second gate structure. The source/drain region includes a semiconductor layer having a first section, a second section, and a third section. A first portion of the semiconductor body is positioned between the first section of the semiconductor layer and the second section of the semiconductor layer. A second portion of the semiconductor body is positioned between the second section of the semiconductor layer and the third section of the semiconductor layer.

公开(公告)号：US20210305103A1

公开(公告)日：2021-09-30

申请号：US16828273

申请日：2020-03-24

Applicant: GLOBALFOUNDRIES U.S. Inc.

Inventor： Sipeng Gu ,  Judson Holt ,  Haiting Wang ,  Bangun Indajang

IPC: H01L21/8238 ,  H01L27/092 ,  H01L29/08 ,  H01L29/10

Abstract: Structures for a field-effect transistor and methods of forming a structure for a field-effect transistor. First and second gate structures extend over the semiconductor body. A source/drain region is positioned laterally between the first gate structure and the second gate structure. The source/drain region includes a semiconductor layer having a first section, a second section, and a third section. A first portion of the semiconductor body is positioned between the first section of the semiconductor layer and the second section of the semiconductor layer. A second portion of the semiconductor body is positioned between the second section of the semiconductor layer and the third section of the semiconductor layer.