ANGLED-WEDGE CHROME-FACE WALL FOR INTENSITY BALANCE OF ALTERNATING PHASE SHIFT MASK
    1.
    发明申请
    ANGLED-WEDGE CHROME-FACE WALL FOR INTENSITY BALANCE OF ALTERNATING PHASE SHIFT MASK 有权
    ANGED-WEDGE CHROME-FACE WALL FOR INTENSITY BALANCE OF ALTERATE PHASE SHIFT MASK

    公开(公告)号:US20100197140A1

    公开(公告)日:2010-08-05

    申请号:US12696067

    申请日:2010-01-29

    IPC分类号: H01L21/027 G03F7/20

    CPC分类号: G03F1/30

    摘要: A method for forming a semiconductor device is presented. The method includes providing a substrate having a photoresist thereon and transmitting a light source through a mask having a pattern onto the photoresist. The mask comprises a mask substrate having first, second and third regions, the third region is disposed between the first and second regions. The mask also includes a light reducing layer over the mask substrate having a first opening over the first region and a second opening over the second region. The first and second openings have layer sidewalls. The sidewalls of the light reducing layer are slanted at an angle less than 90 degrees with the plane of a top surface of the mask substrate. The method also includes developing the photoresist to transfer the pattern of the mask to the photoresist.

    摘要翻译: 提出了一种形成半导体器件的方法。 该方法包括提供其上具有光致抗蚀剂的基底,并通过具有图案的掩模将光源透射到光致抗蚀剂上。 掩模包括具有第一,第二和第三区域的掩模基板,第三区域设置在第一和第二区域之间。 掩模还包括在掩模基板上方的减光层,在第一区域上具有第一开口,在第二区域上具有第二开口。 第一和第二开口具有层侧壁。 减光层的侧壁与掩模基板的顶表面的平面以小于90度的角度倾斜。 该方法还包括显影光致抗蚀剂以将掩模的图案转移到光致抗蚀剂。

    MASK AND METHOD TO PATTERN CHROMELESS PHASE LITHOGRAPHY CONTACT HOLE
    2.
    发明申请
    MASK AND METHOD TO PATTERN CHROMELESS PHASE LITHOGRAPHY CONTACT HOLE 有权
    用于绘制无色相位光刻接触孔的掩模和方法

    公开(公告)号:US20100196805A1

    公开(公告)日:2010-08-05

    申请号:US12695167

    申请日:2010-01-28

    IPC分类号: G03F1/00

    CPC分类号: G03F1/34

    摘要: A method of making a mask is disclosed. The method includes providing a first and a second mask layers and disposing a first phase shift region on the first mask layer. A second phase shift region is disposed on the second mask layer, wherein the first and second phase shift regions are out of phase. A continuous unit cell is formed in the first phase shift region. The unit cell comprises a center section and distinct extension sections. The extension sections are contiguous to and extend outwards from the center section. The distinct extension sections have a same width as the center section. The second phase shift region is adjacent to the unit cell in the first phase shift region.

    摘要翻译: 公开了制作掩模的方法。 该方法包括提供第一和第二掩模层,并在第一掩模层上设置第一相移区域。 第二相移区域设置在第二掩模层上,其中第一和第二相移区域是异相的。 在第一相移区域中形成连续单元。 单元电池包括中心部分和不同的延伸部分。 延伸部分与中心部分相邻并向外延伸。 不同的延伸部分具有与中心部分相同的宽度。 第二相移区域与第一相移区域中的单元电池相邻。