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Patent Agency Ranking
公开(公告)号：US20200041455A1
公开(公告)日：2020-02-06
申请号：US16548602
申请日：2019-08-22
Applicant: General Electric Company
Inventor： Baskaran Ganesan , Satheesh Jeyaraman , Albrecht Maurer
Abstract: A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.
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公开(公告)号：US10152784B2
公开(公告)日：2018-12-11
申请号：US15198876
申请日：2016-06-30
Applicant: General Electric Company
Inventor： Venkata Vijayaraghava Nalladega , Thomas James Batzinger , Yuri Alexeyevich Plotnikov , Shyamsunder Tondanur Mandayam , Bryon Edward Knight , Satheesh Jeyaraman , Esha SenGupta
Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
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3.发明申请公开(公告)号：US20150212048A1
公开(公告)日：2015-07-30
申请号：US14415583
申请日：2013-07-18
Applicant: General Electric Company
Inventor： Baskaran Ganesan , Satheesh Jeyaraman , Albrecht Maurer
CPC classification number: G01N29/04 , G01B17/00 , G01D5/12 , G01N29/043 , G01N29/069 , G01N29/07 , G01N29/4418
Abstract: A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.
Abstract translation: 提供了一种用于确定对象中的几何特征的方法和系统。 该方法包括：接收对入射到物体上的超声波束的至少一个几何特征响应。 入射超声波束由多个超声换能器之一产生。 此外，基于多个对象参数生成对象的体积表示。 物体的体积表示和多个换能器参数用于在物体中产生预测的光束穿越路径。 预测的波束穿越路径用于产生对超声波束的预测飞行几何特征响应时间的时间图。 当接收到的几何特征响应等同于与该位置对应的预测飞行几何特征响应时间时，对象的体积表示的位置被确定为几何特征的位置。
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公开(公告)号：US10393705B2
公开(公告)日：2019-08-27
申请号：US14415583
申请日：2013-07-18
Applicant: General Electric Company
Inventor： Baskaran Ganesan , Satheesh Jeyaraman , Albrecht Maurer
Abstract: A method and system for determination of geometric features in an object is provided. The method includes receiving at least one geometric feature response to an ultrasound beam incident on the object. The incident ultrasound beam is produced from one of a plurality of ultrasound transducers. Further, a volumetric representation of the object is generated based on a plurality of object parameters. The volumetric representation of the object and a plurality of transducer parameters are used to generate a predicted beam traversal path in the object. The predicted beam traversal path is utilized to generate a temporal map of predicted time of flight geometric feature response to the ultrasound beam. A position on the volumetric representation of the object is determined as the location of the geometric feature, when the received geometric feature response is equivalent to the predicted time of flight geometric feature response corresponding to the position.
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公开(公告)号：US20180005368A1
公开(公告)日：2018-01-04
申请号：US15198876
申请日：2016-06-30
Applicant: General Electric Company
Inventor： Venkata Vijayaraghava Nalladega , Thomas James Batzinger , Yuri Alexeyevich Plotnikov , Shyamsunder Tondanur Mandayam , Bryon Edward Knight , Satheesh Jeyaraman , Esha SenGupta
CPC classification number: G06T7/0008 , G01N25/72 , G06T5/50 , G06T2207/10016 , G06T2207/10048 , G06T2207/20221
Abstract: A method for inspecting a component is presented. The method includes inducing, by an inductive coil, an electrical current flow into the component. Further, the method includes capturing, by an infrared (IR) camera, at least a first set of frames and a second set of frames corresponding to the component, wherein the first set of frames is captured at a first time interval and a second set of frames is captured at a second time interval. Also, the method includes constructing, by a processing unit, a thermal image based on at least the first set of frames and the second set of frames corresponding to the component. Furthermore, the method includes determining presence of a thermal signature in the thermal image, wherein the thermal signature is representative of a defect in the component.
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