公开(公告)号：US12222257B2

公开(公告)日：2025-02-11

申请号：US17657175

申请日：2022-03-30

Applicant: GlobalFoundries U.S. Inc.

Inventor： Hanyi Ding ,  Aidong Yan ,  Rongtao Cao

IPC: G01M11/00 ,  G02B6/42

Abstract: A structure for testing a photodiode in a PIC using a grating coupler in optical communication with an optical terminal in a different location of the photodiode from another optical terminal used during operation of the PIC. The photodiode includes an operational optical terminal and a test optical terminal with the test optical terminal in a different location than the operational optical terminal. An optical component is in optical communication with the operational optical terminal of the photodiode and is used during operation of the photodiode and the PIC. A grating coupler is in optical communication with the test optical terminal of the photodiode for testing purposes.

公开(公告)号：US20230314274A1

公开(公告)日：2023-10-05

申请号：US17657175

申请日：2022-03-30

Applicant: GlobalFoundries U.S. Inc.

Inventor： Hanyi Ding ,  Aidong Yan ,  Rongtao Cao

IPC: G01M11/00 ,  G02B6/42

CPC classification number: G01M11/00 ,  G02B6/4206

Abstract: A structure for testing a photodiode in a PIC using a grating coupler in optical communication with an optical terminal in a different location of the photodiode from another optical terminal used during operation of the PIC. The photodiode includes an operational optical terminal and a test optical terminal with the test optical terminal in a different location than the operational optical terminal. An optical component is in optical communication with the operational optical terminal of the photodiode and is used during operation of the photodiode and the PIC. A grating coupler is in optical communication with the test optical terminal of the photodiode for testing purposes.