HIGH VOLTAGE MOSFET DEVICE WITH IMPROVED BREAKDOWN VOLTAGE

    公开(公告)号:US20230290880A1

    公开(公告)日:2023-09-14

    申请号:US17692218

    申请日:2022-03-11

    CPC classification number: H01L29/7816 H01L29/0611

    Abstract: According to various embodiments, there is provided a MOSFET device. The MOSFET device may include a substrate; a first doped region disposed in the substrate; a second doped region disposed in the substrate, wherein the first doped region and the second doped region are laterally adjacent to each other; a third doped region disposed in the first doped region; a fourth doped region disposed in the second doped region; a gate disposed on the substrate, over the first and second doped regions, and between the third and fourth doped regions; and at least one high resistance region embedded in at least the second doped region, wherein the first doped region has a first conductivity type, wherein the second doped region, the third doped region, and the fourth doped region have a second conductivity type, wherein the first conductivity type and the second conductivity type are different.

    SEMICONDUCTOR DEVICE INCLUDING A BODY CONTACT REGION AND METHOD OF FORMING THE SAME

    公开(公告)号:US20230352536A1

    公开(公告)日:2023-11-02

    申请号:US17734135

    申请日:2022-05-02

    CPC classification number: H01L29/1087 H01L21/743

    Abstract: The present disclosure relates to a semiconductor device including a substrate, a first region disposed in the substrate, a terminal region disposed in the first region, a body contact region disposed in the first region and spaced apart from the terminal region, a dielectric layer disposed on the substrate over the first region between the terminal region and the body contact region, an electrically conductive layer disposed on the dielectric layer, and a continuous metallic layer disposed on the electrically conductive layer and extending to the body contact region, the continuous metallic layer disposed on the body contact region and in physical contact with a top and side portions of the electrically conductive layer. The semiconductor device may additionally include a body contact interconnect disposed on a portion of the continuous metallic layer over the electrically conductive layer.

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