GAS DIFFUSION DEVICE, AND WAFER CONTAINER INCLUDING THE SAME

    公开(公告)号:US20230054753A1

    公开(公告)日:2023-02-23

    申请号:US17882703

    申请日:2022-08-08

    IPC分类号: H01L21/673

    摘要: The present invention provides a wafer container and a gas diffusion device applied in the wafer container. The wafer container includes a shell, and all components included and applied on the shell are made of thermal resistance materials. The gas diffusion device and the wafer container, when assembled together, utilize a coupling structure and a collar as a protection mechanism for the gas diffusion device. The gas diffusion device has a buffering chamber that provides a buffering tolerance and a communicating space for the gas before the gas enters an interior space of the wafer container.

    Substrate container system
    3.
    发明授权

    公开(公告)号:US12017841B2

    公开(公告)日:2024-06-25

    申请号:US17363328

    申请日:2021-06-30

    摘要: A substrate container including a container body, a filter member, a back cover is provided. The container body having a top face, a bottom face opposing the top face, a back plate of a first height connecting the top face and the bottom face, a front opening located between the top face and the bottom face, and a back opening opposing the front opening. The front opening enables passage of a substrate and the back opening is located on the back plate and has a smaller second height. The filter member covers the back opening. The back cover establishes sealing engagement with the container body. A gas guiding channel extending in a direction of the first height is formed between the back cover and the container body. The back cover and the filter member define a buffering compartment, and the gas guiding channel has an outlet connecting the buffering compartment.

    WAFER CARRIER MEASURING APPARATUS
    4.
    发明公开

    公开(公告)号:US20240186163A1

    公开(公告)日:2024-06-06

    申请号:US18372202

    申请日:2023-09-25

    IPC分类号: H01L21/67 H01L21/673

    摘要: The present invention provides a measuring apparatus for measuring a wafer carrier having an opening end and at least one gas tower deposited inside, the measuring apparatus comprising a carrying interface for securing the wafer carrier. The opening end of the wafer carrier faces an inspection space of measuring apparatus. The carrying interface having a gas supplying assembly connected to a base of the wafer carrier so as to supply gas to the wafer carrier. The internal of the inspection space disposed a measuring assembly which is mainly used to measure gas flow rate from the gas tower in the accommodating space. The measuring assembly comprises a plurality of wind speed sensing elements and a plurality of displacement sensing element, which are fitted to the a second connecting element.

    RETICLE POD WITH QUICK-RELEASE SUPPORT MECHANISM

    公开(公告)号:US20220238362A1

    公开(公告)日:2022-07-28

    申请号:US17195783

    申请日:2021-03-09

    IPC分类号: H01L21/673

    摘要: The present invention provides a reticle pod comprising a lower cover and a support mechanism. The lower cover includes a carrying surface and a plurality of securing seats distributed on the carrying surface. The support mechanism includes a supporting portion extending upward for supporting a reticle or a reticle carrier, and a securing portion opposite the supporting portion, wherein the securing portion is detachably connected with a corresponding securing seat, so that the support mechanism can be selectively installed on the lower cover.