公开(公告)号：US09551744B2

公开(公告)日：2017-01-24

申请号：US13886927

申请日：2013-05-03

Applicant: HAMILTON SUNDSTRAND CORPORATION

Inventor： Waleed M. Said ,  Harold J. Hansen ,  Hamdi Kozlu ,  Charles V. DeSantis

IPC: G01R31/305 ,  G01R31/28

CPC classification number: G01R31/2817 ,  G01R31/2801

Abstract: A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields.

Abstract translation: 一种方法包括通过测试第一组PWB以产生测试数据来表征电场对第一组印刷电路板（PWB）的影响，使用测试数据确定第一组PWB的介电寿命曲线， 并且基于介电寿命曲线，定义筛选时间和筛选电压以筛选由于电场引起的第二组PWB中的过早故障。

公开(公告)号：US20140218065A1

公开(公告)日：2014-08-07

申请号：US13886927

申请日：2013-05-03

Applicant: HAMILTON SUNDSTRAND CORPORATION

Inventor： Waleed M. Said ,  Harold J. Hansen ,  Hamdi Kozlu ,  Charles V. DeSantis

IPC: G01R31/28

CPC classification number: G01R31/2817 ,  G01R31/2801

Abstract: A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields.

Abstract translation: 一种方法包括通过测试第一组PWB以产生测试数据来表征电场对第一组印刷电路板（PWB）的影响，使用测试数据确定第一组PWB的介电寿命曲线， 并且基于介电寿命曲线，定义筛选时间和筛选电压以筛选由于电场引起的第二组PWB中的过早故障。