Invention Grant
US09551744B2 Detecting early failures in printed wiring boards 有权
检测印刷电路板中的早期故障

Detecting early failures in printed wiring boards
Abstract:
A method includes characterizing the effects of an electric field on a first set of printed wiring boards (PWBs) by testing the first set of PWBs to generate test data, using the test data to determine a dielectric life curve of the first set of PWBs, and based on the dielectric life curve, defining a screening time and a screening voltage to screen for premature failures in a second set of PWBs due to electric fields.
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