Control circuit for bridge MOSFETs

    公开(公告)号:US11677314B2

    公开(公告)日:2023-06-13

    申请号:US17511422

    申请日:2021-10-26

    CPC classification number: H02M1/4225 H02M1/4233 H02M3/1582 H02M7/219

    Abstract: A control circuit for a plurality of metal-oxide semiconductor field-effect transistors (MOSFETs) in a bridge circuit for rectifying an alternating current (AC) input to generate a direct-current (DC) output includes first and second high side controls and first and second low side controls for providing gate voltage signals to respective MOSFETs in the bridge circuit. Dead time controls are provided for establishing dead time intervals between activation of complementary MOSFETs in the bridge circuit. The low side controls provide gate voltage signals having sloped edges and the dead time controls include Zener diodes having reverse bias thresholds for determining the duration of the dead time intervals.

    CONTROL CIRCUIT FOR BRIDGE MOSFETS

    公开(公告)号:US20230127621A1

    公开(公告)日:2023-04-27

    申请号:US17511422

    申请日:2021-10-26

    Abstract: A control circuit for a plurality of metal-oxide semiconductor field-effect transistors (MOSFETs) in a bridge circuit for rectifying an alternating current (AC) input to generate a direct-current (DC) output includes first and second high side controls and first and second low side controls for providing gate voltage signals to respective MOSFETs in the bridge circuit. Dead time controls are provided for establishing dead time intervals between activation of complementary MOSFETs in the bridge circuit. The low side controls provide gate voltage signals having sloped edges and the dead time controls include Zener diodes having reverse bias thresholds for determining the duration of the dead time intervals.

    DIGITAL VOLTAGE SAMPLING
    5.
    发明申请

    公开(公告)号:US20180097526A1

    公开(公告)日:2018-04-05

    申请号:US15567806

    申请日:2015-07-02

    CPC classification number: H03M1/1245 G01R19/2503 G01R19/2509 H03M2201/715

    Abstract: According to some examples, systems and methods are provided for voltage sampling using one or more analog-to-digital converters (ADCs) to sense divided portions of a sampled voltage (e.g., of an output signal), using the one or more analog-to-digital converters to provide a plurality of digital values representative of those divided portions, and combining the plurality of digital values to produce a total digital value representative of the sampled voltage. Such systems and methods can achieve a high resolution for the total digital value while permitting use of ADCs that have a resolution lower than would otherwise be required to achieve the high resolution.

    Digital voltage sampling
    6.
    发明授权

    公开(公告)号:US10250275B2

    公开(公告)日:2019-04-02

    申请号:US15567806

    申请日:2015-07-02

    Abstract: According to some examples, systems and methods are provided for voltage sampling using one or more analog-to-digital converters (ADCs) to sense divided portions of a sampled voltage (e.g., of an output signal), using the one or more analog-to-digital converters to provide a plurality of digital values representative of those divided portions, and combining the plurality of digital values to produce a total digital value representative of the sampled voltage. Such systems and methods can achieve a high resolution for the total digital value while permitting use of ADCs that have a resolution lower than would otherwise be required to achieve the high resolution.

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