PROCESS STATE ANALYSIS DEVICE AND PROCESS STATE DISPLAY METHOD

    公开(公告)号:US20210125387A1

    公开(公告)日:2021-04-29

    申请号:US17254627

    申请日:2019-05-23

    Applicant: HITACHI, LTD.

    Abstract: An embodiment of the process state analysis device of the present invention is provided with an evaluation value calculation unit and a graph creation unit. The evaluation value calculation unit calculates, within an evaluation value calculation range indicating a target range for calculating evaluation values, an evaluation value for each cluster that is classified on the basis of multi-dimensional process data output from each measurement device. The graph creation unit determines a hue for a graph element for each cluster on the basis of the evaluation value for the cluster as calculated within the evaluation value calculation range, and on the basis of a color reference evaluation value corresponding to a reference hue for the graph element, and creates and outputs a graph representing, for each aggregation unit time interval in a specified display period, the number of nodes belonging to each cluster.

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