公开(公告)号：US3697866A

公开(公告)日：1972-10-10

申请号：US3697866D

申请日：1970-11-19

Applicant: HITACHI LTD

Inventor： KANDA KIMIO ,  ONO KUNIO

IPC: G01N3/42 ,  G01N27/72 ,  G01N27/80 ,  G01R33/12

CPC classification number: G01B7/105 ,  G01N27/72

Abstract: A testing instrument for automatically non-destructively determining the hardened depth in accordance with the coercive force of a steel by periodically impressing a D.C. magnetic field externally on the steel by energizing an electromagnet from a D.C. source, measuring the magnetic flux density of said D.C. magnetic field by means of a Hall element while varying the magnetomotive force of said field, integrating the measured value of magnetic flux density, applying the integrated value to the electromagnet alternately with connection of the D.C. source to the electromagnet and reading the value of the magnetomotive force to said field at the point when the magnetic flux density has reached zero or a prescribed value.

Abstract translation: 一种用于根据钢的矫顽力自动地非破坏性地确定硬化深度的测试仪器，通过从直流源激励电磁体周期性地在钢上施加直流磁场，测量所述直流磁铁的磁通密度 通过霍尔元件同时改变所述场的磁动势，积分磁通密度的测量值，将直流电源与电磁体的连接交替地将积分值施加到电磁体并读取磁动势的值 在磁通密度达到零或规定值的时刻到达该场。

公开(公告)号：US3689828A

公开(公告)日：1972-09-05

申请号：US3689828D

申请日：1970-03-17

Applicant: HITACHI LTD

Inventor： KUROSE TADASHI ,  KAGAYA RYUICHI ,  ONO KUNIO ,  KANDA KIMIO

IPC: G01N27/72 ,  G01N27/80 ,  G01R33/12

CPC classification number: G01N27/72 ,  G01B7/105

Abstract: A case depth measuring instrument for measuring the depth of the hardened layer of a steel to be tested, by impressing a D.C. magnetic field on said steel locally from its external quenched surface, measuring the magnetic flux of said field by means of a hall element while varying the magnetomotive force of said field and reading the value of the coercive force of said field at the point when the magnetic flux has reached zero.

Abstract translation: 一种壳体深度测量装置，用于通过从其外部淬火表面局部地施加所述钢上的DC磁场，通过霍尔元件测量所述场的磁通量来测量被测试钢的硬化层的深度， 改变所述磁场的磁动势，并且在磁通量达到零点时读取所述磁场的矫顽磁力的值。

公开(公告)号：US3664743A

公开(公告)日：1972-05-23

申请号：US3664743D

申请日：1969-11-03

Applicant: HITACHI LTD

Inventor： KANDA KIMIO

IPC: G01J3/06 ,  G02F1/03 ,  G01J3/42

CPC classification number: G01J3/06 ,  G02F1/03

Abstract: A SPECTROPHOTOMETER IN WHICH A LIGHT TO BE DIRECTED TO A DETECTOR IS SCANNED AND AT THE SAME TIME IT IS MODULATED IN FREQUENCY CORRESPONDING TO THE WAVELENGTH OF THE LIGHT TO BE SCANNED, THIS AN ANGULAR FREQUENCY OF AN ELECTRIC SIGNAL TAKEN OUT FROM SAID DETECTOR CORRESPONDING TO THE MODULATION IS MADE TO BE SELECTED.