IONIC PROBE
    1.
    发明申请
    IONIC PROBE 有权
    离子探针

    公开(公告)号:US20140034516A1

    公开(公告)日:2014-02-06

    申请号:US14044978

    申请日:2013-10-03

    Applicant: Hach Company

    CPC classification number: G01N27/302 G01N27/36 G01N27/4035

    Abstract: An ionic probe is provided according to the invention. The ionic probe includes an active electrode configured to generate a measurement signal for an external test fluid, a first reference electrode configured to generate a first reference signal, and an at least second reference electrode configured to generate at least a second reference signal. The measurement signal is compared to the first reference signal and the at least second reference signal in order to determine an ionic measurement of the external test fluid.

    Abstract translation: 根据本发明提供离子探针。 离子探针包括被配置为产生用于外部测试流体的测量信号的有源电极,被配置为产生第一参考信号的第一参考电极以及被配置为产生至少第二参考信号的至少第二参考电极。 将测量信号与第一参考信号和至少第二参考信号进行比较,以便确定外部测试流体的离子测量。

    Ionic probe
    2.
    发明授权
    Ionic probe 有权
    离子探针

    公开(公告)号:US08900441B2

    公开(公告)日:2014-12-02

    申请号:US14044978

    申请日:2013-10-03

    Applicant: Hach Company

    CPC classification number: G01N27/302 G01N27/36 G01N27/4035

    Abstract: An ionic probe is provided according to the invention. The ionic probe includes an active electrode configured to generate a measurement signal for an external test fluid, a first reference electrode configured to generate a first reference signal, and an at least second reference electrode configured to generate at least a second reference signal. The measurement signal is compared to the first reference signal and the at least second reference signal in order to determine an ionic measurement of the external test fluid.

    Abstract translation: 根据本发明提供离子探针。 离子探针包括被配置为产生用于外部测试流体的测量信号的有源电极,被配置为产生第一参考信号的第一参考电极以及被配置为产生至少第二参考信号的至少第二参考电极。 将测量信号与第一参考信号和至少第二参考信号进行比较,以便确定外部测试流体的离子测量。

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