摘要:
A digital intermediate frequency transmitter for a wireless communication is disclosed. In accordance with the present invention, an improvement of a modulation quality such as an EVM, a linearity and a power consumption is possible, and a main characteristic of a wireless communication transmitter may be embodied at a low cost through an integration such that a high frequency 90° phase shifter, a voltage controlled oscillator having a 2× frequency or higher and a high frequency I/Q local oscillated signals are not required and a side-band signal may be effectively removed.
摘要:
A digital intermediate frequency transmitter for a wireless communication is disclosed. In accordance with the present invention, an improvement of a modulation quality such as an EVM, a linearity and a power consumption is possible, and a main characteristic of a wireless communication transmitter may be embodied at a low cost through an integration such that a high frequency 90° phase shifter, a voltage controlled oscillator having a 2× frequency or higher and a high frequency I/Q local oscillated signals are not required and a side-band signal may be effectively removed.
摘要:
An fusing apparatus for correcting process variation is provided. The fusing apparatus for correcting the process variation of the semiconductor device includes a fusing part including a fusing resistor fused by a current penetrating; a current driving transistor for fusing the fusing resistor by driving a fusing current according to a fusing enable signal applied; a current path part for building a current path by connecting to the fusing part, and controlling a first node voltage according to a fusing state of the fusing resistor; and a latch part for latching a second node signal inversely amplified from the first node voltage, and outputting the latch value when a power-on reset part operates in a normal mode. Using the fusing cell, the test time can be reduced and the current consumption can be greatly decreased in the fusing process.
摘要:
An fusing apparatus for correcting process variation is provided. The fusing apparatus for correcting the process variation of the semiconductor device includes a fusing part including a fusing resistor fused by a current penetrating; a current driving transistor for fusing the fusing resistor by driving a fusing current according to a fusing enable signal applied; a current path part for building a current path by connecting to the fusing part, and controlling a first node voltage according to a fusing state of the fusing resistor; and a latch part for latching a second node signal inversely amplified from the first node voltage, and outputting the latch value when a power-on reset part operates in a normal mode. Using the fusing cell, the test time can be reduced and the current consumption can be greatly decreased in the fusing process.
摘要:
A complementary transconductance amplifier having a common mode feedback circuit includes a first-type transconductor, a second-type transconductor and a common mode feedback circuit. The first-type transconductor generates a first differential output signal pair in response to a differential input signal pair under the control of a first control signal. The second-type transconductor generates a second differential output signal pair in response to the differential input signal pair under the control of a second control signal. The common mode feedback circuit generates the second control signal in response to the first and second differential output signal pairs under the control of a common mode control signal.