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公开(公告)号:US20080123106A1
公开(公告)日:2008-05-29
申请号:US11722878
申请日:2005-12-23
申请人: Haishan Zeng , Lioudmila Tchvialeva , Tim K. Lee , David I. McLean , Harvey Lui
发明人: Haishan Zeng , Lioudmila Tchvialeva , Tim K. Lee , David I. McLean , Harvey Lui
CPC分类号: A61B5/0066 , A61B5/444 , A61B5/445 , G01B11/303 , G01J9/02 , G01N21/47 , G01N2021/479
摘要: Surface roughness measurements are made by illuminating a surface with coherent light to generate a speckle pattern and studying characteristics of the speckle pattern. The disclosed techniques may be applied to measuring the surface roughness of skin or other biological surfaces. Skin roughness information may be used in the diagnosis of conditions such as malignant melanoma. Methods and apparatus for measuring the coherence length of optical sources involve extracting information about speckle patterns resulting when light from the optical sources interacts with a surface having a known roughness.
摘要翻译: 通过用相干光照射表面以产生斑点图案并研究斑点图案的特征来进行表面粗糙度测量。 所公开的技术可以用于测量皮肤或其他生物表面的表面粗糙度。 皮肤粗糙度信息可用于诊断恶性黑色素瘤等病症。 用于测量光源的相干长度的方法和装置包括提取关于来自光源的光与具有已知粗糙度的表面相互作用的斑点图案的信息。