-
1.
公开(公告)号:US08947092B2
公开(公告)日:2015-02-03
申请号:US13949044
申请日:2013-07-23
发明人: Jing Li , Michael Bittar , Gary Kainer , Marvin Rourke
CPC分类号: G01V3/08 , G06F1/28 , G06F1/3203
摘要: A method for analyzing a subterranean formation porosity is disclosed. The apparent dielectric constant of the subterranean formation and an apparent resistivity of the subterranean formation are measured. The measured values are used to determine a measured formation loss tangent. The formation water loss tangent can be expressed by the water dielectric constant and the water resistivity. The measured formation loss tangent and the formation water loss tangent are then used to determine at least one of an actual dielectric constant of the subterranean formation water and an actual resistivity of the subterranean formation water. The actual formation porosity may be obtained using the estimated water resistivity and water dielectric constant.
摘要翻译: 公开了一种用于分析地下孔隙度的方法。 测量地层的表观介电常数和地层的视电阻率。 测量值用于确定测量的地层损耗角正切值。 地层水分损失角正切值可以用水介电常数和水电阻率表示。 然后使用测量的地层损耗角正切和地层水分损失角正切来确定地下地层水的实际介电常数和地下地层水的实际电阻率中的至少一个。 可以使用估计的水电阻率和水介电常数获得实际的地层孔隙度。
-
2.
公开(公告)号:US20130307546A1
公开(公告)日:2013-11-21
申请号:US13949044
申请日:2013-07-23
发明人: Jing Li , Michael Bittar , Gary Kainer , Marvin Rourke
IPC分类号: G01V3/08
CPC分类号: G01V3/08 , G06F1/28 , G06F1/3203
摘要: A method for analyzing a subterranean formation porosity is disclosed. The apparent dielectric constant of the subterranean formation and an apparent resistivity of the subterranean formation are measured. The measured values are used to determine a measured formation loss tangent. The formation water loss tangent can be expressed by the water dielectric constant and the water resistivity. The measured formation loss tangent and the formation water loss tangent are then used to determine at least one of an actual dielectric constant of the subterranean formation water and an actual resistivity of the subterranean formation water. The actual formation porosity may be obtained using the estimated water resistivity and water dielectric constant.
摘要翻译: 公开了一种用于分析地下孔隙度的方法。 测量地层的表观介电常数和地层的视电阻率。 测量值用于确定测量的地层损耗角正切值。 地层水分损失角正切值可以用水介电常数和水电阻率表示。 然后使用测量的地层损耗角正切和地层水分损失角正切来确定地下地层水的实际介电常数和地下地层水的实际电阻率中的至少一个。 可以使用估计的水电阻率和水介电常数获得实际的地层孔隙度。
-
3.
公开(公告)号:US08698502B2
公开(公告)日:2014-04-15
申请号:US13624047
申请日:2012-09-21
发明人: Jing Li , Gary Kainer , Marvin Rourke , Michael Bittar
IPC分类号: G01V3/08
CPC分类号: G01V3/08 , G01V3/30 , G06F1/28 , G06F1/3203 , Y02D10/126
摘要: A method for analyzing a subterranean formation porosity is disclosed. The apparent dielectric constant of the subterranean formation and an apparent resistivity of the subterranean formation are measured. The measured values are used to determine a measured formation loss tangent. The formation water loss tangent can be expressed by the water dielectric constant and the water resistivity. The measured formation loss tangent and the formation water loss tangent are then used to determine at least one of an actual dielectric constant of the subterranean formation water and an actual resistivity of the subterranean formation water. The actual formation porosity may be obtained using the estimated water resistivity and water dielectric constant.
摘要翻译: 公开了一种用于分析地下孔隙度的方法。 测量地层的表观介电常数和地层的视电阻率。 测量值用于确定测量的地层损耗角正切值。 地层水分损失角正切值可以用水介电常数和水电阻率表示。 然后使用测量的地层损耗角正切和地层水分损失角正切来确定地下地层水的实际介电常数和地下地下水的实际电阻率中的至少一个。 可以使用估计的水电阻率和水介电常数获得实际的地层孔隙度。
-
-