公开(公告)号：US20190065331A1

公开(公告)日：2019-02-28

申请号：US15690903

申请日：2017-08-30

申请人： Harish Singidi ,  Giuseppe Cariello ,  Deping He ,  Scott Anthony Stoller ,  Devin Batutis ,  Preston Thomson

发明人： Harish Singidi ,  Giuseppe Cariello ,  Deping He ,  Scott Anthony Stoller ,  Devin Batutis ,  Preston Thomson

IPC分类号： G06F11/20

CPC分类号： G06F11/2094 ,  G06F11/1068 ,  G06F2201/82 ,  G11C16/0483 ,  G11C16/349 ,  G11C29/832 ,  G11C29/883

摘要： Devices and techniques for a flash memory block retirement policy are disclosed herein. In an example embodiment, a first memory block is removed from service in response to encountering a read error in the first memory block that exceeds a first error threshold. Recoverable data is copied from the first memory block to a second memory block. During each of multiple iterations, the first memory block is erased and programmed, and each page of the first memory block is read. In response to none of the pages exhibiting a read error that exceeds a second error threshold during the multiple iterations, the first memory block is returned to service.

公开(公告)号：US06684173B2

公开(公告)日：2004-01-27

申请号：US09973527

申请日：2001-10-09

申请人： Jeffrey Alan Kessenich ,  Andrei Mihnea ,  Devin Batutis

发明人： Jeffrey Alan Kessenich ,  Andrei Mihnea ,  Devin Batutis

IPC分类号： G06F1900

CPC分类号： G11C29/50 ,  G11C16/04 ,  G11C2029/5006

摘要： The present invention provides a screen for abnormal cells using the cell transconductance. In one embodiment, a method involves reading cells against an elevated reference current while applying an elevated gate voltage, or alternatively, reading all cells against a standard reference current while applying a nominal or elevated gate voltage, and a reduced drain voltage. The abnormal cells fail this test while normal cells pass.

摘要翻译： 本发明提供了使用细胞跨导的异常细胞的筛选。 在一个实施例中，一种方法包括在施加升高的栅极电压的同时读取对抗提升的参考电流的单元，或者替代地，在施加额定或升高的栅极电压以及降低的漏极电压的同时，读取所有的单元对标准参考电流。 正常细胞通过时，异常细胞失败。